On the beam selection and convergence in the Bloch-wave method

J. M. Zuo, A. L. Weickenmeier

Research output: Contribution to journalArticlepeer-review

Abstract

Bloch-wave theory has been a popular tool for simulating electron diffraction patterns for quantitative analysis, such as determination of atomic positions and structure factors. However, up to now no investigations have been published concerning the convergence of this method. In particular it is quite unclear how many and which beams should be included in simulations. Beams are often manually selected in a rather subjective manner. In this paper, three simple criteria for selecting the beams automatically are examined. These criteria can easily be incorporated into existing Bloch-wave programs. Some examples showing the power of this technique are given. Computation experience shows that these three parameters can be manipulated independently to achieve convergence.

Original languageEnglish (US)
Pages (from-to)375-383
Number of pages9
JournalUltramicroscopy
Volume57
Issue number4
DOIs
StatePublished - Mar 1995
Externally publishedYes

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Atomic and Molecular Physics, and Optics
  • Instrumentation

Fingerprint Dive into the research topics of 'On the beam selection and convergence in the Bloch-wave method'. Together they form a unique fingerprint.

Cite this