TY - GEN
T1 - On-Chip Single-Shot Pulse Generator for TDDB Characterization on a Sub-Nanosecond Timescale
AU - Drallmeier, Matthew
AU - Zhou, Yujie
AU - Rosenbaum, Elyse
N1 - Publisher Copyright:
© 2024 IEEE.
PY - 2024
Y1 - 2024
N2 - During charged device model (CDM) electrostatic discharge (ESD) events, MOSFET gate oxides may be exposed to high voltage stress lasting for a few hundred picoseconds or less, and the gate oxide breakdown voltage is an important parameter for ESD designers. This work presents an on-chip pulse generator fabricated in a 65-nm CMOS process capable of producing clean single-shot pulses with amplitude up to 6 V and pulse width as short as 200 ps. The pulse generator is used for an experimental investigation of MOS gate oxide breakdown voltage on a sub-ns timescale and to assess the validity of the power-law model.
AB - During charged device model (CDM) electrostatic discharge (ESD) events, MOSFET gate oxides may be exposed to high voltage stress lasting for a few hundred picoseconds or less, and the gate oxide breakdown voltage is an important parameter for ESD designers. This work presents an on-chip pulse generator fabricated in a 65-nm CMOS process capable of producing clean single-shot pulses with amplitude up to 6 V and pulse width as short as 200 ps. The pulse generator is used for an experimental investigation of MOS gate oxide breakdown voltage on a sub-ns timescale and to assess the validity of the power-law model.
KW - charged device model (CDM)
KW - Electrostatic discharge (ESD)
KW - time dependent dielectric breakdown (TDDB)
UR - http://www.scopus.com/inward/record.url?scp=85194056273&partnerID=8YFLogxK
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U2 - 10.1109/IRPS48228.2024.10529361
DO - 10.1109/IRPS48228.2024.10529361
M3 - Conference contribution
AN - SCOPUS:85194056273
T3 - IEEE International Reliability Physics Symposium Proceedings
BT - 2024 IEEE International Reliability Physics Symposium, IRPS 2024 - Proceedings
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 2024 IEEE International Reliability Physics Symposium, IRPS 2024
Y2 - 14 April 2024 through 18 April 2024
ER -