@inproceedings{b9a367ae907e40c0978d06f94fde4c8e,
title = "On-chip monitors of supply noise generated by system-level ESD",
abstract = "Two supply noise monitor circuits are demonstrated on a 130-nm test chip. These monitors are capable of providing quantitative measurements of on-chip supply voltage perturbations resulting from system-level ESD. Circuit-level simulations reproduce all trends found in the measurement results.",
author = "Nicholas Thomson and Collin Reiman and Yang Xiu and Elyse Rosenbaum",
note = "Funding Information: This work is supported by Semiconductor Research Corporation (SRC) task #1836.141 through The University of Texas at Dallas{\textquoteright} Texas Analog Center of Excellence (TxACE).; 39th Annual Electrical Overstress/Electrostatic Discharge Symposium, EOS/ESD 2017 ; Conference date: 10-09-2017 Through 14-09-2017",
year = "2017",
month = oct,
day = "18",
language = "English (US)",
series = "Electrical Overstress/Electrostatic Discharge Symposium Proceedings",
publisher = "ESD Association",
booktitle = "Electrical Overstress/Electrostatic Discharge Symposium Proceedings 2017, EOS/ESD 2017",
}