On-chip monitors of supply noise generated by system-level ESD

Nicholas Thomson, Collin Reiman, Yang Xiu, Elyse Rosenbaum

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Two supply noise monitor circuits are demonstrated on a 130-nm test chip. These monitors are capable of providing quantitative measurements of on-chip supply voltage perturbations resulting from system-level ESD. Circuit-level simulations reproduce all trends found in the measurement results.

Original languageEnglish (US)
Title of host publicationElectrical Overstress/Electrostatic Discharge Symposium Proceedings 2017, EOS/ESD 2017
PublisherESD Association
ISBN (Electronic)1585372935
StatePublished - Oct 18 2017
Event39th Annual Electrical Overstress/Electrostatic Discharge Symposium, EOS/ESD 2017 - Tucson, United States
Duration: Sep 10 2017Sep 14 2017

Publication series

NameElectrical Overstress/Electrostatic Discharge Symposium Proceedings
ISSN (Print)0739-5159

Other

Other39th Annual Electrical Overstress/Electrostatic Discharge Symposium, EOS/ESD 2017
CountryUnited States
CityTucson
Period9/10/179/14/17

ASJC Scopus subject areas

  • Electrical and Electronic Engineering

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  • Cite this

    Thomson, N., Reiman, C., Xiu, Y., & Rosenbaum, E. (2017). On-chip monitors of supply noise generated by system-level ESD. In Electrical Overstress/Electrostatic Discharge Symposium Proceedings 2017, EOS/ESD 2017 (Electrical Overstress/Electrostatic Discharge Symposium Proceedings). ESD Association.