On-chip monitors of supply noise generated by system-level ESD

Nicholas Thomson, Collin Reiman, Yang Xiu, Elyse Rosenbaum

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Two supply noise monitor circuits are demonstrated on a 130-nm test chip. These monitors are capable of providing quantitative measurements of on-chip supply voltage perturbations resulting from system-level ESD. Circuit-level simulations reproduce all trends found in the measurement results.

Original languageEnglish (US)
Title of host publicationElectrical Overstress/Electrostatic Discharge Symposium Proceedings 2017, EOS/ESD 2017
PublisherESD Association
ISBN (Electronic)1585372935
StatePublished - Oct 18 2017
Event39th Annual Electrical Overstress/Electrostatic Discharge Symposium, EOS/ESD 2017 - Tucson, United States
Duration: Sep 10 2017Sep 14 2017

Publication series

NameElectrical Overstress/Electrostatic Discharge Symposium Proceedings
ISSN (Print)0739-5159

Other

Other39th Annual Electrical Overstress/Electrostatic Discharge Symposium, EOS/ESD 2017
CountryUnited States
CityTucson
Period9/10/179/14/17

Fingerprint

Networks (circuits)
Electric potential

ASJC Scopus subject areas

  • Electrical and Electronic Engineering

Cite this

Thomson, N., Reiman, C., Xiu, Y., & Rosenbaum, E. (2017). On-chip monitors of supply noise generated by system-level ESD. In Electrical Overstress/Electrostatic Discharge Symposium Proceedings 2017, EOS/ESD 2017 (Electrical Overstress/Electrostatic Discharge Symposium Proceedings). ESD Association.

On-chip monitors of supply noise generated by system-level ESD. / Thomson, Nicholas; Reiman, Collin; Xiu, Yang; Rosenbaum, Elyse.

Electrical Overstress/Electrostatic Discharge Symposium Proceedings 2017, EOS/ESD 2017. ESD Association, 2017. (Electrical Overstress/Electrostatic Discharge Symposium Proceedings).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Thomson, N, Reiman, C, Xiu, Y & Rosenbaum, E 2017, On-chip monitors of supply noise generated by system-level ESD. in Electrical Overstress/Electrostatic Discharge Symposium Proceedings 2017, EOS/ESD 2017. Electrical Overstress/Electrostatic Discharge Symposium Proceedings, ESD Association, 39th Annual Electrical Overstress/Electrostatic Discharge Symposium, EOS/ESD 2017, Tucson, United States, 9/10/17.
Thomson N, Reiman C, Xiu Y, Rosenbaum E. On-chip monitors of supply noise generated by system-level ESD. In Electrical Overstress/Electrostatic Discharge Symposium Proceedings 2017, EOS/ESD 2017. ESD Association. 2017. (Electrical Overstress/Electrostatic Discharge Symposium Proceedings).
Thomson, Nicholas ; Reiman, Collin ; Xiu, Yang ; Rosenbaum, Elyse. / On-chip monitors of supply noise generated by system-level ESD. Electrical Overstress/Electrostatic Discharge Symposium Proceedings 2017, EOS/ESD 2017. ESD Association, 2017. (Electrical Overstress/Electrostatic Discharge Symposium Proceedings).
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