On-Chip ESD protection for RF I/Os: Devices, circuits and models

Elyse Rosenbaum; Sami Hyvonen

doi:10.1109/ISCAS.2005.1464809

On-Chip ESD protection for RF I/Os: Devices, circuits and models

Research output: Contribution to journal › Conference article › peer-review

Abstract

ESD protection circuits load RF I/O pads. The negative effect on RF performance can be limited by careful construction and layout of the protection devices. The cancellation technique extends the range of frequencies for which the protection circuit has an acceptably small effect on RF performance.

Original language	English (US)
Article number	1464809
Pages (from-to)	1202-1205
Number of pages	4
Journal	Proceedings - IEEE International Symposium on Circuits and Systems
DOIs	https://doi.org/10.1109/ISCAS.2005.1464809
State	Published - 2005
Event	IEEE International Symposium on Circuits and Systems 2005, ISCAS 2005 - Kobe, Japan Duration: May 23 2005 → May 26 2005

ASJC Scopus subject areas

Electrical and Electronic Engineering

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10.1109/ISCAS.2005.1464809

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title = "On-Chip ESD protection for RF I/Os: Devices, circuits and models",

abstract = "ESD protection circuits load RF I/O pads. The negative effect on RF performance can be limited by careful construction and layout of the protection devices. The cancellation technique extends the range of frequencies for which the protection circuit has an acceptably small effect on RF performance.",

author = "Elyse Rosenbaum and Sami Hyvonen",

year = "2005",

doi = "10.1109/ISCAS.2005.1464809",

language = "English (US)",

pages = "1202--1205",

journal = "Proceedings - IEEE International Symposium on Circuits and Systems",

issn = "0271-4310",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

note = "IEEE International Symposium on Circuits and Systems 2005, ISCAS 2005 ; Conference date: 23-05-2005 Through 26-05-2005",

}

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T1 - On-Chip ESD protection for RF I/Os

T2 - IEEE International Symposium on Circuits and Systems 2005, ISCAS 2005

AU - Rosenbaum, Elyse

AU - Hyvonen, Sami

PY - 2005

Y1 - 2005

N2 - ESD protection circuits load RF I/O pads. The negative effect on RF performance can be limited by careful construction and layout of the protection devices. The cancellation technique extends the range of frequencies for which the protection circuit has an acceptably small effect on RF performance.

AB - ESD protection circuits load RF I/O pads. The negative effect on RF performance can be limited by careful construction and layout of the protection devices. The cancellation technique extends the range of frequencies for which the protection circuit has an acceptably small effect on RF performance.

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U2 - 10.1109/ISCAS.2005.1464809

DO - 10.1109/ISCAS.2005.1464809

M3 - Conference article

AN - SCOPUS:67649133338

SN - 0271-4310

SP - 1202

EP - 1205

JO - Proceedings - IEEE International Symposium on Circuits and Systems

JF - Proceedings - IEEE International Symposium on Circuits and Systems

M1 - 1464809

Y2 - 23 May 2005 through 26 May 2005

ER -

On-Chip ESD protection for RF I/Os: Devices, circuits and models

Abstract

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