On-Chip ESD protection for RF I/Os: Devices, circuits and models

Elyse Rosenbaum, Sami Hyvonen

Research output: Contribution to journalConference article

Abstract

ESD protection circuits load RF I/O pads. The negative effect on RF performance can be limited by careful construction and layout of the protection devices. The cancellation technique extends the range of frequencies for which the protection circuit has an acceptably small effect on RF performance.

Original languageEnglish (US)
Article number1464809
Pages (from-to)1202-1205
Number of pages4
JournalProceedings - IEEE International Symposium on Circuits and Systems
DOIs
StatePublished - Dec 1 2005
EventIEEE International Symposium on Circuits and Systems 2005, ISCAS 2005 - Kobe, Japan
Duration: May 23 2005May 26 2005

ASJC Scopus subject areas

  • Electrical and Electronic Engineering

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