On a probabilistic view of commonality for product evolution and reuse

Vijitashwa Pandey, Deborah Thurston, Zissimos P. Mourelatos

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Product line commonality has been claimed to be a means to improving efficiency in design and manufacturing of multiple products. Numerous metrics exist in the literature to quantify the level of commonality in a product line. It remains unclear how and why commonality should be measured and accounted for in product design. In this paper, four desired properties of commonality indices are identified: scalability, ability to incorporate subjective information, ease of updating of the index when new information becomes available and applicability in assessing reuse potential. We propose metrics based on a probability based interpretation of commonality to account for these requirements. With the use of results in probability theory we show how the metric exhibits properties missing in other metrics proposed in the literature. The metric also takes into account generations of products easily and can be used to measure their reusability. We demonstrate the method using a slider-crank mechanism product line example.

Original languageEnglish (US)
Title of host publicationASME 2011 International Design Engineering Technical Conferences and Computers and Information in Engineering Conference, IDETC/CIE 2011
Pages885-893
Number of pages9
DOIs
StatePublished - Dec 1 2011
EventASME 2011 International Design Engineering Technical Conferences and Computers and Information in Engineering Conference, IDETC/CIE 2011 - Washington, DC, United States
Duration: Aug 28 2011Aug 31 2011

Publication series

NameProceedings of the ASME Design Engineering Technical Conference
Volume9

Other

OtherASME 2011 International Design Engineering Technical Conferences and Computers and Information in Engineering Conference, IDETC/CIE 2011
Country/TerritoryUnited States
CityWashington, DC
Period8/28/118/31/11

Keywords

  • Bayes' theorem
  • Commonality indices
  • Conjugate priors
  • Produce reuse
  • Product line commonality

ASJC Scopus subject areas

  • Modeling and Simulation
  • Mechanical Engineering
  • Computer Science Applications
  • Computer Graphics and Computer-Aided Design

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