Observations of fixed and mobile charge in composite mems resonators

G. Bahl, R. Melamud, B. Kim, S. Chandorkar, J. Salvia, M. A. Hopcroft, R. G. Hennessy, S. Yoneoka, C. M. Jha, G. Yama, D. Elata, R. N. Candler, R. T. Howe, T. W. Kenny

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

This paper investigates dielectric charge in oxide-coated composite-beam silicon electrostatic resonators. The effects of charge in the oxide layers on resonant frequency are theoretically modeled. Evidence for the presence of both fixed and mobile charge is presented through experimental studies. It is shown that the motion of charge is controllable through the bias voltage applied to the resonator. These studies are relevant for improving the reliability of non-contacting MEMS where dielectrics may be present such as timing references, inertial sensors, and optical actuators.

Original languageEnglish (US)
Title of host publication2008 Solid-State Sensors, Actuators, and Microsystems Workshop
EditorsKimberly L. Turner, Leland Spangler
PublisherTransducer Research Foundation
Pages102-105
Number of pages4
ISBN (Electronic)0964002477, 9780964002470
DOIs
StatePublished - 2008
Externally publishedYes
Event2008 Solid-State Sensors, Actuators, and Microsystems Workshop - Hilton Head Island, United States
Duration: Jun 1 2008Jun 5 2008

Publication series

NameTechnical Digest - Solid-State Sensors, Actuators, and Microsystems Workshop

Conference

Conference2008 Solid-State Sensors, Actuators, and Microsystems Workshop
Country/TerritoryUnited States
CityHilton Head Island
Period6/1/086/5/08

ASJC Scopus subject areas

  • Control and Systems Engineering
  • Electrical and Electronic Engineering
  • Hardware and Architecture

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