Observation of point defect in silicon using HRTEM

Sung Il Baik; Hee Suk Chung; Jian Min Zuo; Young Woon Kim

doi:10.1017/S143192760488423X

Observation of point defect in silicon using HRTEM

Sung Il Baik, Hee Suk Chung, Jian Min Zuo, Young Woon Kim

Research output: Contribution to journal › Article › peer-review

Original language	English (US)
Pages (from-to)	994-995
Number of pages	2
Journal	Microscopy and Microanalysis
Volume	10
Issue number	SUPPL. 2
DOIs	https://doi.org/10.1017/S143192760488423X
State	Published - 2004

ASJC Scopus subject areas

Instrumentation

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10.1017/S143192760488423X

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title = "Observation of point defect in silicon using HRTEM",

author = "Baik, {Sung Il} and Chung, {Hee Suk} and Zuo, {Jian Min} and Kim, {Young Woon}",

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pages = "994--995",

journal = "Microscopy and Microanalysis",

issn = "1431-9276",

publisher = "Cambridge University Press",

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AU - Baik, Sung Il

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AU - Zuo, Jian Min

AU - Kim, Young Woon

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DO - 10.1017/S143192760488423X

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SN - 1431-9276

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SP - 994

EP - 995

JO - Microscopy and Microanalysis

JF - Microscopy and Microanalysis

IS - SUPPL. 2

ER -

Observation of point defect in silicon using HRTEM

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