NTIRE 2017 Challenge on Single Image Super-Resolution: Methods and Results

Radu Timofte, Eirikur Agustsson, Luc Van Gool, Ming Hsuan Yang, Lei Zhang, Bee Lim, Sanghyun Son, Heewon Kim, Seungjun Nah, Kyoung Mu Lee, Xintao Wang, Yapeng Tian, Ke Yu, Yulun Zhang, Shixiang Wu, Chao Dong, Liang Lin, Yu Qiao, Chen Change Loy, Woong BaeJaejun Yoo, Yoseob Han, Jong Chul Ye, Jae Seok Choi, Munchurl Kim, Yuchen Fan, Jiahui Yu, Wei Han, Ding Liu, Haichao Yu, Zhangyang Wang, Honghui Shi, Xinchao Wang, Thomas S. Huang, Yunjin Chen, Kai Zhang, Wangmeng Zuo, Zhimin Tang, Linkai Luo, Shaohui Li, Min Fu, Lei Cao, Wen Heng, Giang Bui, Truc Le, Ye Duan, Dacheng Tao, Ruxin Wang, Xu Lin, Jianxin Pang, Jinchang Xu, Yu Zhao, Xiangyu Xu, Jinshan Pan, Deqing Sun, Yujin Zhang, Xibin Song, Yuchao Dai, Xueying Qin, Xuan Phung Huynh, Tiantong Guo, Hojjat Seyed Mousavi, Tiep Huu Vu, Vishal Monga, Cristovao Cruz, Karen Egiazarian, Vladimir Katkovnik, Rakesh Mehta, Arnav Kumar Jain, Abhinav Agarwalla, Ch V.Sai Praveen, Ruofan Zhou, Hongdiao Wen, Che Zhu, Zhiqiang Xia, Zhengtao Wang, Qi Guo

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

This paper reviews the first challenge on single image super-resolution (restoration of rich details in an low resolution image) with focus on proposed solutions and results. A new DIVerse 2K resolution image dataset (DIV2K) was employed. The challenge had 6 competitions divided into 2 tracks with 3 magnification factors each. Track 1 employed the standard bicubic downscaling setup, while Track 2 had unknown downscaling operators (blur kernel and decimation) but learnable through low and high res train images. Each competition had b∼100 registered participants and 20 teams competed in the final testing phase. They gauge the state-of-the-art in single image super-resolution.

Original languageEnglish (US)
Title of host publicationProceedings - 30th IEEE Conference on Computer Vision and Pattern Recognition Workshops, CVPRW 2017
PublisherIEEE Computer Society
Pages1110-1121
Number of pages12
ISBN (Electronic)9781538607336
DOIs
StatePublished - Aug 22 2017
Event30th IEEE Conference on Computer Vision and Pattern Recognition Workshops, CVPRW 2017 - Honolulu, United States
Duration: Jul 21 2017Jul 26 2017

Publication series

NameIEEE Computer Society Conference on Computer Vision and Pattern Recognition Workshops
Volume2017-July
ISSN (Print)2160-7508
ISSN (Electronic)2160-7516

Other

Other30th IEEE Conference on Computer Vision and Pattern Recognition Workshops, CVPRW 2017
Country/TerritoryUnited States
CityHonolulu
Period7/21/177/26/17

ASJC Scopus subject areas

  • Computer Vision and Pattern Recognition
  • Electrical and Electronic Engineering

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