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N2 defects in silicon nitride for quantum applications

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

We present preliminary data on Raman-active nitrogen molecules trapped in amorphous silicon nitride thin films, and detail the potential use of these emitters for quantum applications.

Original languageEnglish (US)
Title of host publicationCLEO
Subtitle of host publicationApplications and Technology, CLEO_AT 2020
PublisherOptica Publishing Group (formerly OSA)
ISBN (Electronic)9781943580767
ISBN (Print)9781943580767
DOIs
StatePublished - 2020
EventCLEO: Applications and Technology, CLEO_AT 2020 - Washington, United States
Duration: May 10 2020May 15 2020

Publication series

NameOptics InfoBase Conference Papers
VolumePart F181-CLEO-AT 2020
ISSN (Electronic)2162-2701

Conference

ConferenceCLEO: Applications and Technology, CLEO_AT 2020
Country/TerritoryUnited States
CityWashington
Period5/10/205/15/20

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Mechanics of Materials

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