Novel method of measuring microelectronic interconnect transmission line parameters and discontinuity equivalent electrical parameters using multiple reflections

Charles E. Abernethy, Andreas C. Cangellaris, John L. Prince

Research output: Contribution to journalConference article

Abstract

This paper describes a novel technique which measures the electrical properties of transmission lines (such as microstrip) and extracts equivalent electrical parameters for discontinuities in transmission lines with remarkable precision using a modern network analyzer and newly developed de-embedding software. This technique has successfully measured the per-unit-length inductance (L′), resistance (R′), capacitance (C′), and dielectric loss conductance (G′) of microstrip transmission lines made from solid copper and conductive polymer. These materials have been studied at frequencies up to 201 MHz, and higher frequencies are possible. Discontinuities, such as an opening in the ground plane under the microstrip, have also been characterized at frequencies up to 2400 MHz. Measurements of characteristic impedances and skin resistances made by this method are in agreement with theoretical models. Higher frequency measurements should be feasible using a higher frequency network analyzer.

Original languageEnglish (US)
Pages (from-to)329-336
Number of pages8
JournalProceedings - Electronic Components and Technology Conference
StatePublished - Jan 1 1995
Externally publishedYes
EventProceedings of the 1995 45th Electronic Components & Technology Conference - Las Vegas, NV, USA
Duration: May 21 1995May 24 1995

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Electrical and Electronic Engineering

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