Novel algorithms for fast statistical analysis of scaled circuits

Amith Singhee, Rob A. Rutenbar

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Original languageEnglish (US)
Title of host publicationNovel Algorithms for Fast Statistical Analysis of Scaled Circuits
Pages1-191
Number of pages191
DOIs
StatePublished - Oct 1 2009

Publication series

NameLecture Notes in Electrical Engineering
Volume46 LNEE
ISSN (Print)1876-1100
ISSN (Electronic)1876-1119

ASJC Scopus subject areas

  • Industrial and Manufacturing Engineering

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