Note: Electrical and thermal characterization of a ferroelectric thin film with an electro-thermal nanoprobe

R. Jackson, P. C. Fletcher, K. Jambunathan, A. R. Damodaran, J. N. Emmerich, H. Teng, L. W. Martin, William Paul King, Y. Wu

Research output: Contribution to journalReview article

Abstract

The localized temperature-dependent piezoelectric response of ferroelectric barium strontium titanate (BST) thin films is studied using an electro-thermal (ET) nanoprobe. The ET probe provides independent electrical and thermal excitation to a nanometer-scale volume of the specimen and is capable of detecting the phase transition temperature of the BST thin films. The piezoresponse measured by the ET probe follows the temperature dependence of the piezoelectric constant, whereas with bulk heating the response follows the temperature dependence of the spontaneous polarization. The observed differences stem from the localized inhomogeneous electro-thermal field distribution at the specimen.

Original languageEnglish (US)
Article number076105
JournalReview of Scientific Instruments
Volume83
Issue number7
DOIs
StatePublished - Jul 1 2012

Fingerprint

Nanoprobes
Ferroelectric thin films
strontium
barium
temperature dependence
probes
Barium strontium titanate
thin films
stems
transition temperature
heating
polarization
Thin films
excitation
Temperature
Superconducting transition temperature
Ferroelectric materials
Phase transitions
temperature
Hot Temperature

ASJC Scopus subject areas

  • Instrumentation

Cite this

Jackson, R., Fletcher, P. C., Jambunathan, K., Damodaran, A. R., Emmerich, J. N., Teng, H., ... Wu, Y. (2012). Note: Electrical and thermal characterization of a ferroelectric thin film with an electro-thermal nanoprobe. Review of Scientific Instruments, 83(7), [076105]. https://doi.org/10.1063/1.4733730

Note : Electrical and thermal characterization of a ferroelectric thin film with an electro-thermal nanoprobe. / Jackson, R.; Fletcher, P. C.; Jambunathan, K.; Damodaran, A. R.; Emmerich, J. N.; Teng, H.; Martin, L. W.; King, William Paul; Wu, Y.

In: Review of Scientific Instruments, Vol. 83, No. 7, 076105, 01.07.2012.

Research output: Contribution to journalReview article

Jackson, R, Fletcher, PC, Jambunathan, K, Damodaran, AR, Emmerich, JN, Teng, H, Martin, LW, King, WP & Wu, Y 2012, 'Note: Electrical and thermal characterization of a ferroelectric thin film with an electro-thermal nanoprobe', Review of Scientific Instruments, vol. 83, no. 7, 076105. https://doi.org/10.1063/1.4733730
Jackson, R. ; Fletcher, P. C. ; Jambunathan, K. ; Damodaran, A. R. ; Emmerich, J. N. ; Teng, H. ; Martin, L. W. ; King, William Paul ; Wu, Y. / Note : Electrical and thermal characterization of a ferroelectric thin film with an electro-thermal nanoprobe. In: Review of Scientific Instruments. 2012 ; Vol. 83, No. 7.
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