Nonlocal Time-Resolved Terahertz Spectroscopy in the near Field

Angela Pizzuto, Enrique Castro-Camus, William Wilson, Wonsik Choi, Xiuling Li, Daniel M. Mittleman

Research output: Contribution to journalArticlepeer-review

Abstract

Scattering-type near-field optical microscopy (s-SNOM) has enabled subwavelength spectroscopy measurements on a wide variety of materials and over a large spectral range. These tip-based measurements are of particular interest in the long wavelength regimes, where the study of individual nanoscale samples is very challenging. The combination of s-SNOM techniques with short pulse durations has opened a new realm of possibilities in which nanosystems can be characterized with both high spatial and temporal resolution, for example via optical-pump, terahertz-probe measurements. Here, we demonstrate the first "nonlocal"pump-probe measurement using a scattering-type scanning near-field microscopy technique, in which the pump spot is laterally displaced from the probe location. We observe nonlocal effects corresponding to this pump-probe offset, associated with carrier drift into the s-SNOM near-field probe region.

Original languageEnglish (US)
Pages (from-to)2904-2911
Number of pages8
JournalACS Photonics
Volume8
Issue number10
DOIs
StatePublished - Oct 20 2021

Keywords

  • THz
  • atomic force microscopy
  • near-field microscopy
  • s-SNOM

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Atomic and Molecular Physics, and Optics
  • Electrical and Electronic Engineering
  • Biotechnology

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