Abstract
An optical method for characterization of polymer and other thin film is described. The method permits noninvasive determination of anisotropic elastic moduli and thermal diffusivities and assessment of whether a film is adhered to or delaminated from a substrate. Optically generated acoustic waves and thermal responses are monitored in real time to provide the information. Possibilities for characterization of adhesion quality and for miniaturization of the measurement apparatus are discussed.
| Original language | English (US) |
|---|---|
| Title of host publication | Annual Technical Conference - ANTEC, Conference Proceedings |
| Publisher | Soc of Plastics Engineers |
| Pages | 2812-2815 |
| Number of pages | 4 |
| Volume | 2 |
| State | Published - 1995 |
| Event | Proceedings of the 53rd Annual Technical Conference. Part 1 (of 3) - Boston, MA, USA Duration: May 7 1995 → Oct 11 1995 |
Other
| Other | Proceedings of the 53rd Annual Technical Conference. Part 1 (of 3) |
|---|---|
| City | Boston, MA, USA |
| Period | 5/7/95 → 10/11/95 |
ASJC Scopus subject areas
- General Engineering