Abstract
Dielectric fluctuations are shown to be the dominant source of noncontact friction in high-sensitivity scanning probe microscopy of dielectric materials. Recent measurements have directly determined the friction acting on custom-fabricated single-crystal silicon cantilevers whose capacitively charged tips are located 3-200 nm above thin films of poly(methyl methacrylate), poly(vinyl acetate), and polystyrene. Differences in measured friction among these polymers are explained here by relating electric field fluctuations at the cantilever tip to dielectric relaxation of the polymer.
| Original language | English (US) |
|---|---|
| Pages (from-to) | 14525-14528 |
| Number of pages | 4 |
| Journal | Journal of Physical Chemistry B |
| Volume | 110 |
| Issue number | 30 |
| DOIs | |
| State | Published - Aug 3 2006 |
| Externally published | Yes |
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ASJC Scopus subject areas
- Surfaces, Coatings and Films
- Physical and Theoretical Chemistry
- Materials Chemistry
Cite this
Noncontact dielectric friction. / Kuehn, Seppe; Marohn, John A.; Loring, Roger F.
In: Journal of Physical Chemistry B, Vol. 110, No. 30, 03.08.2006, p. 14525-14528.Research output: Contribution to journal › Article
}
TY - JOUR
T1 - Noncontact dielectric friction
AU - Kuehn, Seppe
AU - Marohn, John A.
AU - Loring, Roger F.
PY - 2006/8/3
Y1 - 2006/8/3
N2 - Dielectric fluctuations are shown to be the dominant source of noncontact friction in high-sensitivity scanning probe microscopy of dielectric materials. Recent measurements have directly determined the friction acting on custom-fabricated single-crystal silicon cantilevers whose capacitively charged tips are located 3-200 nm above thin films of poly(methyl methacrylate), poly(vinyl acetate), and polystyrene. Differences in measured friction among these polymers are explained here by relating electric field fluctuations at the cantilever tip to dielectric relaxation of the polymer.
AB - Dielectric fluctuations are shown to be the dominant source of noncontact friction in high-sensitivity scanning probe microscopy of dielectric materials. Recent measurements have directly determined the friction acting on custom-fabricated single-crystal silicon cantilevers whose capacitively charged tips are located 3-200 nm above thin films of poly(methyl methacrylate), poly(vinyl acetate), and polystyrene. Differences in measured friction among these polymers are explained here by relating electric field fluctuations at the cantilever tip to dielectric relaxation of the polymer.
UR - http://www.scopus.com/inward/record.url?scp=33748324600&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=33748324600&partnerID=8YFLogxK
U2 - 10.1021/jp061865n
DO - 10.1021/jp061865n
M3 - Article
C2 - 16869550
AN - SCOPUS:33748324600
VL - 110
SP - 14525
EP - 14528
JO - Journal of Physical Chemistry B Materials
JF - Journal of Physical Chemistry B Materials
SN - 1520-6106
IS - 30
ER -