Abstract
A new circuit technique, referred to as the twin-transistor technique, for increasing the noise immunity of dynamic logic circuits is presented. This technique makes dynamic logic gates more tolerant to noise appearing at the gate inputs. A multiply-accumulate circuit has been designed and fabricated using a 0.35μm process to verify this technique. Experimental results indicate that the twin-transistor technique provides a significant improvement in the noise immunity of dynamic circuits (>2.4X) with only a modest increase in power dissipation (15%) and no loss in throughput.
Original language | English (US) |
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Pages (from-to) | 425-428 |
Number of pages | 4 |
Journal | Proceedings of the Custom Integrated Circuits Conference |
State | Published - 2000 |
Event | CICC 2000: 22nd Annual Custom Integrated Circuits Conference - Orlando, FL, USA Duration: May 21 2000 → May 24 2000 |
ASJC Scopus subject areas
- Electrical and Electronic Engineering