Nickel-silicon interfacial adhesion strength measured by laser spallation

Xiao Yan, Jacob M. Diamond, Nathan J. Fritz, Satoshi Matsuo, Kazi F. Rabbi, Ishrat Zarin, Nenad Miljkovic, Paul V. Braun, Nancy R. Sottos

Research output: Contribution to journalArticlepeer-review

Abstract

Thin films of amorphous silicon (a-Si) coated on metals such as nickel (Ni) are one of the most promising anode architectures for high-energy-density lithium-ion (Li-ion) batteries. The performance and longevity of batteries with this type of electrode depend on the integrity of the Ni/a-Si interface. The integrity of the a-Si /Ni bonded interface during cycling is critical, but the experimental characterization of interfacial failure of this material system is highly challenging and there is a sparsity of interface strength data in the literature. Here, we describe a laser spallation (LS) technique to characterize the interfacial adhesion strength of Ni/a-Si multilayer films created by chemical vapor deposition (CVD). The LS technique enables the non-contact measurement of the tensile interfacial strength with high precision when compared to conventional methods for characterizing adhesion. Interferometric measurement combined with finite element analysis shows that the Ni/a-Si interface, created via the CVD of a-Si on Ni surfaces can withstand ≈46-72 MPa in tension before failure initiation. To ensure successful and precise characterization of interfacial adhesion strength using LS, we further develop a design criterion for multi-layer samples by analyzing the thin-film mechanics. Our study provides insights into the strength of the Ni/a-Si interface that governs the performance and durability of high-energy-density anodes and offers design guidelines for improving thin-film electrode integrity.

Original languageEnglish (US)
Article number165302
JournalJournal of Applied Physics
Volume135
Issue number16
DOIs
StatePublished - Apr 28 2024

ASJC Scopus subject areas

  • General Physics and Astronomy

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