New method of Bravais lattice determination

Research output: Contribution to journalArticlepeer-review

Abstract

A new method of Bravais lattice determination from a single convergent beam electron diffraction (CBED) pattern is proposed. The method is based on the principle that a primitive reciprocal lattice cell can be measured accurately from the deficiency line of medium or high order reflections or high order Laue zone (HOLZ) line positions within the central disk of a single CBED pattern taken near an arbitrary zone axis. This primitive cell can be reduced to the unique Niggli cell and thus the Bravais cell by Krivy and Gruber reduction procedures. This method could be very useful in identifying phase of mixed phase materials or as the first step toward determination of a new structure or as an automated procedure of indexing diffraction patterns of known structure.

Original languageEnglish (US)
Pages (from-to)459-464
Number of pages6
JournalUltramicroscopy
Volume52
Issue number3-4
DOIs
StatePublished - Dec 1993
Externally publishedYes

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Atomic and Molecular Physics, and Optics
  • Instrumentation

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