New approaches for sample-profile estimation for fast atomic force microscopy

Srinivasa M. Salapaka, Tathagata De Tathagata, Abu Sebastian

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

The Atomic Force Microscope (AFM) is a powerful tool for imaging and manipulating matter at the nanoscale. The sample-profile estimation problem in Atomic Force Microscopy is addressed using ℋ control. A new estimate signal for the sample profile is proposed and it is proved that this signal tracks perfectly the profile signal, i.e., the transfer function between the profile signal and the estimate signal is one. Experimental results are presented to corroborate these results.

Original languageEnglish (US)
Title of host publicationProceedings of the ASME Dynamic Systems and Control Division 2005
Pages1317-1326
Number of pages10
Edition2 PART B
DOIs
StatePublished - Dec 1 2005
Event2005 ASME International Mechanical Engineering Congress and Exposition, IMECE 2005 - Orlando, FL, United States
Duration: Nov 5 2005Nov 11 2005

Publication series

NameAmerican Society of Mechanical Engineers, Dynamic Systems and Control Division (Publication) DSC
Number2 PART B
Volume74 DSC

Other

Other2005 ASME International Mechanical Engineering Congress and Exposition, IMECE 2005
CountryUnited States
CityOrlando, FL
Period11/5/0511/11/05

ASJC Scopus subject areas

  • Mechanical Engineering
  • Software

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