TY - GEN
T1 - New approaches for sample-profile estimation for fast atomic force microscopy
AU - Salapaka, Srinivasa M.
AU - De Tathagata, Tathagata
AU - Sebastian, Abu
PY - 2005
Y1 - 2005
N2 - The Atomic Force Microscope (AFM) is a powerful tool for imaging and manipulating matter at the nanoscale. The sample-profile estimation problem in Atomic Force Microscopy is addressed using ℋ∞ control. A new estimate signal for the sample profile is proposed and it is proved that this signal tracks perfectly the profile signal, i.e., the transfer function between the profile signal and the estimate signal is one. Experimental results are presented to corroborate these results.
AB - The Atomic Force Microscope (AFM) is a powerful tool for imaging and manipulating matter at the nanoscale. The sample-profile estimation problem in Atomic Force Microscopy is addressed using ℋ∞ control. A new estimate signal for the sample profile is proposed and it is proved that this signal tracks perfectly the profile signal, i.e., the transfer function between the profile signal and the estimate signal is one. Experimental results are presented to corroborate these results.
UR - http://www.scopus.com/inward/record.url?scp=33645696802&partnerID=8YFLogxK
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U2 - 10.1115/IMECE2005-80511
DO - 10.1115/IMECE2005-80511
M3 - Conference contribution
AN - SCOPUS:33645696802
SN - 0791842169
SN - 9780791842164
T3 - American Society of Mechanical Engineers, Dynamic Systems and Control Division (Publication) DSC
SP - 1317
EP - 1326
BT - Proceedings of the ASME Dynamic Systems and Control Division 2005
T2 - 2005 ASME International Mechanical Engineering Congress and Exposition, IMECE 2005
Y2 - 5 November 2005 through 11 November 2005
ER -