Abstract
Selectively oxidized vertical cavity surface emitting lasers (VCSELs) have been studied by spectrally resolved near-field scanning optical microscopy. We have obtained spatially and spectrally resolved images of both subthreshold emission and lasing emission from a selectively oxidized VCSEL operating at a wavelength of 850 nm. Below threshold, highly local high gain regions, emitting local intensity maxima within the active area, were observed; these were found to serve as lasing centers just above threshold. Above threshold, the near-field spatial modal distributions of low order transverse modes were identified by spectrally analyzing the emission; these were found to be complex and somewhat different from those measured in the far field.
Original language | English (US) |
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Pages (from-to) | 526-528 |
Number of pages | 3 |
Journal | Applied Physics Letters |
Volume | 76 |
Issue number | 5 |
DOIs | |
State | Published - Jan 31 2000 |
Externally published | Yes |
ASJC Scopus subject areas
- Physics and Astronomy (miscellaneous)