Near-field spectroscopy of selectively oxidized vertical cavity surface emitting lasers

J. Kim, J. T. Boyd, Howard E. Jackson, K. D. Choquette

Research output: Contribution to journalArticlepeer-review

Abstract

Selectively oxidized vertical cavity surface emitting lasers (VCSELs) have been studied by spectrally resolved near-field scanning optical microscopy. We have obtained spatially and spectrally resolved images of both subthreshold emission and lasing emission from a selectively oxidized VCSEL operating at a wavelength of 850 nm. Below threshold, highly local high gain regions, emitting local intensity maxima within the active area, were observed; these were found to serve as lasing centers just above threshold. Above threshold, the near-field spatial modal distributions of low order transverse modes were identified by spectrally analyzing the emission; these were found to be complex and somewhat different from those measured in the far field.

Original languageEnglish (US)
Pages (from-to)526-528
Number of pages3
JournalApplied Physics Letters
Volume76
Issue number5
DOIs
StatePublished - Jan 31 2000
Externally publishedYes

ASJC Scopus subject areas

  • Physics and Astronomy (miscellaneous)

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