Nanostructure of porous silicon using transmission microscopy

M. H. Nayfeh, Z. Yamani, O. Gurdal, A. Aiaql

Research output: Contribution to journalConference articlepeer-review

Abstract

We use high resolution transmission electron microscopy (XTEM) to image the nanostructure of (100) p-type porous Si. A network of pore tracks subdivide the material into nanoislands and nanocrystallites are resolved through out the material. With distance from the substrate, electron diffraction develops, in addition to coherent diffraction, amorphous-like patterns that dominates the coherent scattering in the topmost luminescent layer. Also, with distance from the substrate, crystalline island size diminishes to as small as 1 nm in the topmost luminescence material. Although their uppermost layer has the most resolved nano crystallites, it has the strongest diffuse scattering of all regions. This suggests that the diffuse scattering is due to a size reduction effects rather than to an amorphous state. We discuss the relevance of a new dimer restructuring model in ultra small nanocrystallites to the loss of crystalline effects.

Original languageEnglish (US)
Pages (from-to)191-196
Number of pages6
JournalMaterials Research Society Symposium - Proceedings
Volume536
StatePublished - 1999
EventProceedings of the 1998 MRS Fall Meeting - The Symposium 'Advanced Catalytic Materials-1998' - Boston, MA, USA
Duration: Nov 30 1998Dec 3 1998

ASJC Scopus subject areas

  • Condensed Matter Physics
  • Mechanics of Materials
  • Mechanical Engineering
  • General Materials Science

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