Nanoscale topography and spatial light modulator characterization using wide-field quantitative phase imaging

Gannavarpu Rajshekhar, Basanta Bhaduri, Chris Edwards, Renjie Zhou, Lynford L. Goddard, Gabriel Popescu

Research output: Contribution to journalArticle

Abstract

We demonstrate an optical technique for large field of view quantitative phase imaging of reflective samples. It relies on a common-path interferometric design, which ensures high stability without the need for active stabilization. The technique provides single-shot, full-field and robust measurement of nanoscale topography of large samples. Further, the inherent stability allows reliable measurement of the temporally varying phase retardation of the liquid crystal cells, and thus enables real-time characterization of spatial light modulators. The technique's application potential is validated through experimental results.

Original languageEnglish (US)
Pages (from-to)3432-3438
Number of pages7
JournalOptics Express
Volume22
Issue number3
DOIs
StatePublished - Feb 10 2014

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light modulators
topography
shot
field of view
stabilization
liquid crystals
cells

ASJC Scopus subject areas

  • Atomic and Molecular Physics, and Optics

Cite this

Nanoscale topography and spatial light modulator characterization using wide-field quantitative phase imaging. / Rajshekhar, Gannavarpu; Bhaduri, Basanta; Edwards, Chris; Zhou, Renjie; Goddard, Lynford L.; Popescu, Gabriel.

In: Optics Express, Vol. 22, No. 3, 10.02.2014, p. 3432-3438.

Research output: Contribution to journalArticle

Rajshekhar, Gannavarpu ; Bhaduri, Basanta ; Edwards, Chris ; Zhou, Renjie ; Goddard, Lynford L. ; Popescu, Gabriel. / Nanoscale topography and spatial light modulator characterization using wide-field quantitative phase imaging. In: Optics Express. 2014 ; Vol. 22, No. 3. pp. 3432-3438.
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