Abstract
Localized heat generation, with dimensions of the order of 10 nm, takes place in the drain regions of current transistors, resulting in an increase in thermal resistance near such a hotspot. We present a model based on the phonon Boltzmann transport equation (BTE) that agrees well with data for hotspots in simple geometries. The model suggests that scattering rates of optical phonons are key to the conduction physics. We use molecular dynamics to obtain phonon relaxation rates and show their dependence on the energy density in the hotspot. This work improves the constitutive modeling of heat flow in nanoscale devices.
Original language | English (US) |
---|---|
Pages | 734-735 |
Number of pages | 2 |
State | Published - Sep 20 2004 |
Externally published | Yes |
Event | ITherm 2004 - Ninth Intersociety Conference on Thermal and Thermomechanical Phenomena in Electronic Systems - Las Vegas, NV, United States Duration: Jun 1 2004 → Jun 4 2004 |
Other
Other | ITherm 2004 - Ninth Intersociety Conference on Thermal and Thermomechanical Phenomena in Electronic Systems |
---|---|
Country/Territory | United States |
City | Las Vegas, NV |
Period | 6/1/04 → 6/4/04 |
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Condensed Matter Physics
- Electrical and Electronic Engineering
- Materials Chemistry