Abstract
The relationship between sample structure and data in volume-scanning backscattering mode near-field optical microscopy is investigated. It is shown that the three-dimensional structure of a dielectric sample is encoded in the phase and amplitude of the scattered field and that an approximate reconstruction of the sample structure may be obtained.
| Original language | English (US) |
|---|---|
| Article number | 121108 |
| Journal | Applied Physics Letters |
| Volume | 95 |
| Issue number | 12 |
| DOIs | |
| State | Published - 2009 |
| Externally published | Yes |
ASJC Scopus subject areas
- Physics and Astronomy (miscellaneous)