Nanoscale optical tomography using volume-scanning near-field microscopy

Jin Sun; John C. Schotland; Rainer Hillenbrand; P. Scott Carney

doi:10.1063/1.3224177

Nanoscale optical tomography using volume-scanning near-field microscopy

Jin Sun, John C. Schotland, Rainer Hillenbrand, P. Scott Carney

Research output: Contribution to journal › Article › peer-review

Abstract

The relationship between sample structure and data in volume-scanning backscattering mode near-field optical microscopy is investigated. It is shown that the three-dimensional structure of a dielectric sample is encoded in the phase and amplitude of the scattered field and that an approximate reconstruction of the sample structure may be obtained.

Original language	English (US)
Article number	121108
Journal	Applied Physics Letters
Volume	95
Issue number	12
DOIs	https://doi.org/10.1063/1.3224177
State	Published - 2009
Externally published	Yes

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Physics and Astronomy (miscellaneous)

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10.1063/1.3224177

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title = "Nanoscale optical tomography using volume-scanning near-field microscopy",

abstract = "The relationship between sample structure and data in volume-scanning backscattering mode near-field optical microscopy is investigated. It is shown that the three-dimensional structure of a dielectric sample is encoded in the phase and amplitude of the scattered field and that an approximate reconstruction of the sample structure may be obtained.",

author = "Jin Sun and Schotland, {John C.} and Rainer Hillenbrand and Carney, {P. Scott}",

note = "Funding Information: The work of P.S.C. was supported in part by U.S. Air Force MURI Grant No. F49620-03-10379 and in part by the National Science Foundation under CAREER Award Grant No. 0239265. J.C.S. acknowledges support by the NSF under the Grant No. DMR 0425780 and by the USAFOSR under the Grant No. FA9550-07-1-0096. ",

year = "2009",

doi = "10.1063/1.3224177",

language = "English (US)",

volume = "95",

journal = "Applied Physics Letters",

issn = "0003-6951",

publisher = "American Institute of Physics",

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T1 - Nanoscale optical tomography using volume-scanning near-field microscopy

AU - Sun, Jin

AU - Schotland, John C.

AU - Hillenbrand, Rainer

AU - Carney, P. Scott

N1 - Funding Information: The work of P.S.C. was supported in part by U.S. Air Force MURI Grant No. F49620-03-10379 and in part by the National Science Foundation under CAREER Award Grant No. 0239265. J.C.S. acknowledges support by the NSF under the Grant No. DMR 0425780 and by the USAFOSR under the Grant No. FA9550-07-1-0096.

PY - 2009

Y1 - 2009

N2 - The relationship between sample structure and data in volume-scanning backscattering mode near-field optical microscopy is investigated. It is shown that the three-dimensional structure of a dielectric sample is encoded in the phase and amplitude of the scattered field and that an approximate reconstruction of the sample structure may be obtained.

AB - The relationship between sample structure and data in volume-scanning backscattering mode near-field optical microscopy is investigated. It is shown that the three-dimensional structure of a dielectric sample is encoded in the phase and amplitude of the scattered field and that an approximate reconstruction of the sample structure may be obtained.

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Nanoscale optical tomography using volume-scanning near-field microscopy

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