Nanoscale optical tomography based on volume-scanning near-field microscopy

John C Schotland (Inventor), Paul Scott Carney (Inventor), Jin Sun (Inventor), Rainer Hillenbrand (Inventor)

Research output: Patent

Abstract

An apparatus and methods for nanoscale optical tomography based on back-scattering mode near-field scanning optical microscopy with a volumetric scan of the probe. The back-scattered data collected by a volumetric scan of the probe contains three-dimensional structural information of the sample, which enables reconstruction of the dielectric sample without other mechanical movements of the instrument.
Original languageEnglish (US)
U.S. patent number7978343
Filing date3/17/09
StatePublished - Jul 12 2011

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