@inproceedings{d2a7aea9e5f74e1ba60a9e78e08761c4,
title = "Nanoscale IR spectroscopy of polymer systems using an atomic force microscope",
abstract = "We describe a lab based AFM based IR measurement capability that can obtain local spectra and IR maps over the spectral range of 1000-4000cm-1 with spatial resolution as high as 100nm. We demonstrate this new capability on a polymer multilayer.",
keywords = "AFM, Infrared spectroscopy, Polymer",
author = "Gregory Meyers and Carl Reinhardt and Felts, {Jonathan R.} and King, {William P.} and Prater, {Craig B.} and Debra Cook and Kevin Kjoller",
year = "2010",
language = "English (US)",
isbn = "9781617386602",
series = "Annual Technical Conference - ANTEC, Conference Proceedings",
pages = "1684--1687",
booktitle = "68th Annual Technical Conference of the Society of Plastics Engineers 2010, ANTEC 2010",
note = "68th Annual Technical Conference of the Society of Plastics Engineers 2010, ANTEC 2010 ; Conference date: 16-05-2010 Through 20-05-2010",
}