Nanoscale IR spectroscopy of polymer systems using an atomic force microscope

Gregory Meyers, Carl Reinhardt, Jonathan R. Felts, William P. King, Craig B. Prater, Debra Cook, Kevin Kjoller

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

We describe a lab based AFM based IR measurement capability that can obtain local spectra and IR maps over the spectral range of 1000-4000cm-1 with spatial resolution as high as 100nm. We demonstrate this new capability on a polymer multilayer.

Original languageEnglish (US)
Title of host publication68th Annual Technical Conference of the Society of Plastics Engineers 2010, ANTEC 2010
Pages1684-1687
Number of pages4
StatePublished - Sep 27 2010
Event68th Annual Technical Conference of the Society of Plastics Engineers 2010, ANTEC 2010 - Orlando, FL, United States
Duration: May 16 2010May 20 2010

Publication series

NameAnnual Technical Conference - ANTEC, Conference Proceedings
Volume3

Other

Other68th Annual Technical Conference of the Society of Plastics Engineers 2010, ANTEC 2010
CountryUnited States
CityOrlando, FL
Period5/16/105/20/10

Keywords

  • AFM
  • Infrared spectroscopy
  • Polymer

ASJC Scopus subject areas

  • Chemical Engineering(all)
  • Polymers and Plastics

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