TY - GEN
T1 - Nanofabrication using heated probe tips
AU - Felts, Jonathan R.
AU - Fletcher, Patrick C.
AU - Somnath, Suhas
AU - Pikul, James
AU - Dai, Zhenting
AU - Lee, Woo Kyung
AU - Sheehan, Paul E.
AU - King, William Paul
PY - 2011
Y1 - 2011
N2 - We present progress towards scalable, high precision nanofabrication in a variety of materials using heated Atomic Force Microscope (AFM) probes. Temperature control of a heated AFM tip allows nanometer scale thermochemical patterning, deposition of thermoplastic polymers, and surface melting. The challenges that must be overcome to scale such a technology to industrial-scale manufacturing include tip wear, thermal and mechanical control of the cantilever, chemical reaction control at the tip-surface interface, and fabrication throughput. To mitigate tip wear, we have integrated nanocrystalline diamond films onto our heated AFM probe tip. Such diamond tips are extremely resistant to wear and fouling at a self-heating temperature of 400 C and load force of 200 nN over long distances. To improve cantilever temperature control, a closed loop feedback control was designed to allow for 0.2 C precision temperature control during nanolithography. Electrohydrodynamic jetting controls the deposition of polyethylene onto a heated probe tip. Finally, to address throughput, we have fabricated cantilever arrays having independent temperature control and integrated them into a commercial AFM system. We show these advances by patterning thousands of nanostructures of polyethylene and poly(3-dodecylthiophene), with cumulative length more than 2 mm and patterning accuracy better than 50 nm.
AB - We present progress towards scalable, high precision nanofabrication in a variety of materials using heated Atomic Force Microscope (AFM) probes. Temperature control of a heated AFM tip allows nanometer scale thermochemical patterning, deposition of thermoplastic polymers, and surface melting. The challenges that must be overcome to scale such a technology to industrial-scale manufacturing include tip wear, thermal and mechanical control of the cantilever, chemical reaction control at the tip-surface interface, and fabrication throughput. To mitigate tip wear, we have integrated nanocrystalline diamond films onto our heated AFM probe tip. Such diamond tips are extremely resistant to wear and fouling at a self-heating temperature of 400 C and load force of 200 nN over long distances. To improve cantilever temperature control, a closed loop feedback control was designed to allow for 0.2 C precision temperature control during nanolithography. Electrohydrodynamic jetting controls the deposition of polyethylene onto a heated probe tip. Finally, to address throughput, we have fabricated cantilever arrays having independent temperature control and integrated them into a commercial AFM system. We show these advances by patterning thousands of nanostructures of polyethylene and poly(3-dodecylthiophene), with cumulative length more than 2 mm and patterning accuracy better than 50 nm.
KW - Atomic Force Microscope
KW - nanolithography
KW - nanomanufacturing
KW - thermal dip pen nanolithography
UR - http://www.scopus.com/inward/record.url?scp=79957999602&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=79957999602&partnerID=8YFLogxK
U2 - 10.1117/12.883992
DO - 10.1117/12.883992
M3 - Conference contribution
AN - SCOPUS:79957999602
SN - 9780819486059
T3 - Proceedings of SPIE - The International Society for Optical Engineering
BT - Micro- and Nanotechnology Sensors, Systems, and Applications III
T2 - Micro- and Nanotechnology Sensors, Systems, and Applications III
Y2 - 25 April 2011 through 29 April 2011
ER -