Multiple probe interactions in near-field imaging

P. Scott Carney, Jin Sun, John C. Schotland

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

We consider effects of a strongly scattering tip in near-field scanning optical microscopy. It is shown that multiple tip-substrate interactions have a dramatic effect on the spectroscopic response of the instrument with important implications for the solution of the inverse scattering problem.

Original languageEnglish (US)
Title of host publication19th Annual Meeting of the IEEE Lasers and Electro-Optics Society, LEOS
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages691-692
Number of pages2
ISBN (Print)0780395557, 9780780395558
DOIs
StatePublished - Jan 1 2006
Event19th Annual Meeting of the IEEE Lasers and Electro-Optics Society, LEOS - Montreal, QC, Canada
Duration: Oct 29 2006Nov 2 2006

Publication series

NameConference Proceedings - Lasers and Electro-Optics Society Annual Meeting-LEOS
ISSN (Print)1092-8081

Other

Other19th Annual Meeting of the IEEE Lasers and Electro-Optics Society, LEOS
CountryCanada
CityMontreal, QC
Period10/29/0611/2/06

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Electrical and Electronic Engineering

Fingerprint Dive into the research topics of 'Multiple probe interactions in near-field imaging'. Together they form a unique fingerprint.

  • Cite this

    Carney, P. S., Sun, J., & Schotland, J. C. (2006). Multiple probe interactions in near-field imaging. In 19th Annual Meeting of the IEEE Lasers and Electro-Optics Society, LEOS (pp. 691-692). [4054372] (Conference Proceedings - Lasers and Electro-Optics Society Annual Meeting-LEOS). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/LEOS.2006.278901