Multi-spectral intensity diffraction tomography

Mark A. Anastasio, Daxin Shi, Greg Gbur

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

A theory of multi-spectral intensity diffraction tomography (I-DT) is described. Unlike conventional I-DT that requires intensity measurements on a pair of detector planes, this method uses measurements on a single detector plane at two frequencies.

Original languageEnglish (US)
Title of host publicationFrontiers in Optics, FiO 2006
PublisherOptical Society of America (OSA)
ISBN (Print)1557528187, 9781557528186
DOIs
StatePublished - Jan 1 2006
Externally publishedYes
EventFrontiers in Optics, FiO 2006 - Rochester, NY, United States
Duration: Oct 10 2006Oct 10 2006

Publication series

NameOptics InfoBase Conference Papers
ISSN (Electronic)2162-2701

Other

OtherFrontiers in Optics, FiO 2006
CountryUnited States
CityRochester, NY
Period10/10/0610/10/06

ASJC Scopus subject areas

  • Instrumentation
  • Atomic and Molecular Physics, and Optics

Fingerprint Dive into the research topics of 'Multi-spectral intensity diffraction tomography'. Together they form a unique fingerprint.

  • Cite this

    Anastasio, M. A., Shi, D., & Gbur, G. (2006). Multi-spectral intensity diffraction tomography. In Frontiers in Optics, FiO 2006 (Optics InfoBase Conference Papers). Optical Society of America (OSA). https://doi.org/10.1364/fio.2006.fmi5