Abstract
A sensor system including a first layer having first and second surfaces and a first index of refraction, a second layer having a second index of refraction which is less than the first index of refraction, a mechanism for generating a first diffuse light beam which passes through the first layer from the first surface to the second surface, and a mechanism for sensing a portion of the first diffuse light beam reflected back through the first layer to the first surface as an incident of the first diffuse light beam impinging upon the second layer. Also a method of determining the properties of a medium, the method including the steps of generating a first diffuse light beam, passing the first diffuse light beam through a first surface of a first medium having a first index of refraction, causing a portion of the first diffuse light beam to pass through the first medium, to impinge upon a second medium having a second index of refraction less than the first index of refraction and to reflect back to the first surface, and sensing the portion of the first diffuse light beam reflected back to the first surface.
Original language | English (US) |
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U.S. patent number | 5694210 |
State | Published - Dec 2 1997 |