Motion and structure from point correspondences: A robust algorithm for planar case with error estimation

Juyang Weng, Narendra Ahuja, Thomas S. Huang

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

The problem of determining motion and structure for a planar surface and the error estimation are discussed. Since the motion of a planar patch is a degenerate case for linear algorithms (algorithms that consist of solving mainly linear equations and give a closed-form solution) for general surfaces, the motion of such a planar surface is considered separately. An algorithm is introduced that gives a closed-form solution to motion parameters using monocular perspective images of the points on a planar surface. The algorithm is simpler and more reliable, in the presence of noise, than existing ones. There are generally two solutions for two image frames. For three image frames the solution is generally unique. An approach is proposed to test whether the points are coplanar. The errors in the motion parameters and surface structure can be estimated for each pair of images. Specificially, the standard deviation of the errors is calculated in terms of the variance of the errors in the image coordinates. This approach to estimating errors is applicable to least-squares, pseudo-inverse and eigenvalue--eigenvector problems.

Original languageEnglish (US)
Title of host publicationProceedings - International Conference on Pattern Recognition
PublisherPubl by IEEE
Pages247-251
Number of pages5
ISBN (Print)0818608781
StatePublished - Dec 1 1988

Publication series

NameProceedings - International Conference on Pattern Recognition

ASJC Scopus subject areas

  • Computer Vision and Pattern Recognition

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  • Cite this

    Weng, J., Ahuja, N., & Huang, T. S. (1988). Motion and structure from point correspondences: A robust algorithm for planar case with error estimation. In Proceedings - International Conference on Pattern Recognition (pp. 247-251). (Proceedings - International Conference on Pattern Recognition). Publ by IEEE.