TY - JOUR
T1 - Morphology of Thin-Film Nafion on Carbon as an Analogue of Fuel Cell Catalyst Layers
AU - Randall, Corey R.
AU - Zou, Lianfeng
AU - Wang, Howard
AU - Hui, Jingshu
AU - Rodríguez-López, Joaquín
AU - Chen-Glasser, Melodie
AU - Dura, Joseph A.
AU - DeCaluwe, Steven C.
N1 - This study was made possible thanks to the support and resources of multiple institutions and individuals. We would like to thank the scientists and scheduling teams at the NIST Center for Neutron Research and the Spallation Neutron Source (SNS) at the Oak Ridge National Laboratory, in particular, Dr. Jim Browning, Dr. John Ankner, and Dr. Candice Halbert from SNS who assisted with training on the LIQREF and automating data reduction. Neutron reflectometry measurements would not have been possible without help from these laboratories and their teams. Regarding XPS data processing, Dr. Jeanette Owejan at BASF and Dr. Svitlana Pylypenko and PhD candidate Jayson Foster at Colorado School of Mines each provided valuable suggestions. Their experienced insight improved how XPS data was incorporated into the broader narrative of this work. Additionally, Dr. Rebecca Miller from the Analytical Resources Core (RRID: SCR_021758) at Colorado State University and Dr. Thomas Moffat from NIST each provided assistance in taking XPS measurements. Last, thanks to Dr. Scott Mauger and Dr. Severin Habisreutinger from the National Renewable Energy Laboratory for preparing the C layer. NR fitting was performec using resources at the High-Performance Computer group at Colorado School of Mines; thanks to the staff there for providing advice on best practices. Financial support for this work was sponsored by the U.S. Department of Energy, Office of Basic Energy Sciences, Division of Materials and Engineering under Early Career Award #DE-SC0018019, Dr. Helen Kerch, Program Manager, which supported NR on the C sample, XPS of the rGO and C samples, and fitting of all NR and XPS data. The National Academies’ Research Associateship Program supported the NR measurement of both rGO samples. 60 60 60 a
This study was made possible thanks to the support and resources of multiple institutions and individuals. We would like to thank the scientists and scheduling teams at the NIST Center for Neutron Research and the Spallation Neutron Source (SNS) at the Oak Ridge National Laboratory, in particular, Dr. Jim Browning, Dr. John Ankner, and Dr. Candice Halbert from SNS who assisted with training on the LIQREF and automating data reduction. Neutron reflectometry measurements would not have been possible without help from these laboratories and their teams. Regarding XPS data processing, Dr. Jeanette Owejan at BASF and Dr. Svitlana Pylypenko and PhD candidate Jayson Foster at Colorado School of Mines each provided valuable suggestions. Their experienced insight improved how XPS data was incorporated into the broader narrative of this work. Additionally, Dr. Rebecca Miller from the Analytical Resources Core (RRID: SCR_021758) at Colorado State University and Dr. Thomas Moffat from NIST each provided assistance in taking XPS measurements. Last, thanks to Dr. Scott Mauger and Dr. Severin Habisreutinger from the National Renewable Energy Laboratory for preparing the C60 layer. NR fitting was performec using resources at the High-Performance Computer group at Colorado School of Mines; thanks to the staff there for providing advice on best practices. Financial support for this work was sponsored by the U.S. Department of Energy, Office of Basic Energy Sciences, Division of Materials and Engineering under Early Career Award #DE-SC0018019, Dr. Helen Kerch, Program Manager, which supported NR on the C60 sample, XPS of the rGO and C60 samples, and fitting of all NR and XPS data. The National Academies’ Research Associateship Program supported the NR measurement of both rGO samples.
PY - 2024/1/24
Y1 - 2024/1/24
N2 - Species transport in thin-film Nafion heavily influences proton-exchange membrane (PEMFC) performance, particularly in low-platinum-loaded cells. Literature suggests that phase-segregated nanostructures in hydrated Nafion thin films can reduce species mobility and increase transport losses in cathode catalyst layers. However, these structures have primarily been observed at silicon-Nafion interfaces rather than at more relevant material (e.g., Pt and carbon black) interfaces. In this work, we use neutron reflectometry and X-ray photoelectron spectroscopy to investigate carbon-supported Nafion thin films. Measurements were taken in humidified environments for Nafion thin films (≈30-80 nm) on four different carbon substrates. Results show a variety of interfacial morphologies in carbon-supported Nafion. Differences in carbon samples’ roughness, surface chemistry, and hydrophilicity suggest that thin-film Nafion phase segregation is impacted by multiple substrate characteristics. For instance, hydrophilic substrates with smooth surfaces correlate with a high likelihood of lamellar phase segregation parallel to the substrate. When present, the lamellar structures are less pronounced than those observed at silicon oxide interfaces. Local oscillations in water volume fraction for the lamellae were less severe, and the lamellae were thinner and were not observed when the water was removed, all in contrast to Nafion-silicon interfaces. For hydrophobic and rough samples, phase segregation was more isotropic rather than lamellar. Results suggest that Nafion in PEMFC catalyst layers is less influenced by the interface compared with thin films on silicon. Despite this, our results demonstrate that neutron reflectometry measurements of silicon-Nafion interfaces are valuable for PEMFC performance predictions, as water uptake in the majority Nafion layers (i.e., the uniformly hydrated region beyond the lamellar region) trends similarly with thickness, regardless of support material.
AB - Species transport in thin-film Nafion heavily influences proton-exchange membrane (PEMFC) performance, particularly in low-platinum-loaded cells. Literature suggests that phase-segregated nanostructures in hydrated Nafion thin films can reduce species mobility and increase transport losses in cathode catalyst layers. However, these structures have primarily been observed at silicon-Nafion interfaces rather than at more relevant material (e.g., Pt and carbon black) interfaces. In this work, we use neutron reflectometry and X-ray photoelectron spectroscopy to investigate carbon-supported Nafion thin films. Measurements were taken in humidified environments for Nafion thin films (≈30-80 nm) on four different carbon substrates. Results show a variety of interfacial morphologies in carbon-supported Nafion. Differences in carbon samples’ roughness, surface chemistry, and hydrophilicity suggest that thin-film Nafion phase segregation is impacted by multiple substrate characteristics. For instance, hydrophilic substrates with smooth surfaces correlate with a high likelihood of lamellar phase segregation parallel to the substrate. When present, the lamellar structures are less pronounced than those observed at silicon oxide interfaces. Local oscillations in water volume fraction for the lamellae were less severe, and the lamellae were thinner and were not observed when the water was removed, all in contrast to Nafion-silicon interfaces. For hydrophobic and rough samples, phase segregation was more isotropic rather than lamellar. Results suggest that Nafion in PEMFC catalyst layers is less influenced by the interface compared with thin films on silicon. Despite this, our results demonstrate that neutron reflectometry measurements of silicon-Nafion interfaces are valuable for PEMFC performance predictions, as water uptake in the majority Nafion layers (i.e., the uniformly hydrated region beyond the lamellar region) trends similarly with thickness, regardless of support material.
KW - Nafion phase segregation
KW - PEMFC
KW - catalyst layer
KW - neutron reflectometry
KW - thin films
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U2 - 10.1021/acsami.3c14912
DO - 10.1021/acsami.3c14912
M3 - Article
C2 - 38212130
AN - SCOPUS:85182568271
SN - 1944-8244
VL - 16
SP - 3311
EP - 3324
JO - ACS Applied Materials and Interfaces
JF - ACS Applied Materials and Interfaces
IS - 3
ER -