Modifying the surface electronic properties of YBa2Cu3O7-δ with cryogenic scanning probe microscopy

S. Urazhdin, W. K. Neils, S. H. Tessmer, Norman O. Birge, D. J. Van Harlingen

Research output: Contribution to journalArticlepeer-review

Abstract

We report the results of a cryogenic study of the modification of YBa2Cu3O7-δ surface electronic properties with the probe of a scanning tunnelling microscope (STM). A negative voltage applied to the sample during STM tunnelling is found to modify locally the conductance of the native degraded surface layer. When the degraded layer is removed by etching, the effect disappears. An additional surface effect is identified using scanning Kelvin probe microscopy in combination with STM. We observe reversible surface charging for both etched and unetched samples, indicating the presence of a defect layer even on a surface never exposed to air.

Original languageEnglish (US)
Pages (from-to)88-92
Number of pages5
JournalSuperconductor Science and Technology
Volume17
Issue number1
DOIs
StatePublished - Jan 2004

ASJC Scopus subject areas

  • Ceramics and Composites
  • Condensed Matter Physics
  • Metals and Alloys
  • Electrical and Electronic Engineering
  • Materials Chemistry

Fingerprint Dive into the research topics of 'Modifying the surface electronic properties of YBa<sub>2</sub>Cu<sub>3</sub>O<sub>7-δ</sub> with cryogenic scanning probe microscopy'. Together they form a unique fingerprint.

Cite this