@inproceedings{fe165f884f91428fa9d263a4226fd745,
title = "Modeling of majority and minority carrier triggered external latchup",
abstract = "Circuit models are presented that allow one to identify the worst-case testing condition for external latchup and to simulate the value of the latchup trigger current. The models are valid under both moderate and high-level injection. A good fit between the model and the measurements is observed. The roles of substrate majority and minority carriers are elucidated.",
keywords = "Circuit models, Latchup",
author = "Farzan Farbiz and Elyse Rosenbaum",
year = "2008",
doi = "10.1109/RELPHY.2008.4558897",
language = "English (US)",
isbn = "9781424420506",
series = "IEEE International Reliability Physics Symposium Proceedings",
pages = "270--277",
booktitle = "46th Annual 2008 IEEE International Reliability Physics Symposium Proceedings, IRPS",
note = "46th Annual 2008 IEEE International Reliability Physics Symposium, IRPS ; Conference date: 27-04-2008 Through 01-05-2008",
}