| Original language | English (US) |
|---|---|
| Pages (from-to) | 920-921 |
| Number of pages | 2 |
| Journal | Microscopy and Microanalysis |
| Volume | 14 |
| Issue number | SUPPL. 2 |
| DOIs | |
| State | Published - Aug 2008 |
ASJC Scopus subject areas
- Instrumentation
Modeling electron diffraction and imaging in microscopes with aberration correctors for quantitative materials structural analysis
J. M. Zuo, W. J. Huang, A. Shah, R. Kröeger
Research output: Contribution to journal › Article › peer-review