Modeling capacitor derating in power integrity simulation

Tianjian Lu, Ken Wu, Zhiping Yang, Jian Ming Jin

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

In this work, we propose a simulation methodology that incorporates derating models of decoupling capacitors for power integrity analysis. The construction of the derating models of decoupling capacitors is based on the impedance measurement and curve fitting method. Three approaches of impedance measurement are compared and the most accurate one is selected to build the derating models. The curve fitting method converts the measured impedance into circuit models. A library file containing the derating models is generated such that it can be repeatedly used for different products at various design cycles. The derating library takes into account the operation conditions such as temperature and DC bias as well as the vendor information. The proposed simulation methodology with the derating library achieves high accuracy, which is demonstrated through correlations with measurements.

Original languageEnglish (US)
Title of host publication2017 IEEE International Symposium on Electromagnetic Compatibility, Signal and Power Integrity, EMCSI 2017 - Proceedings
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages567-572
Number of pages6
ISBN (Electronic)9781538622308
DOIs
StatePublished - Oct 20 2017
Event2017 IEEE International Symposium on Electromagnetic Compatibility, Signal and Power Integrity, EMCSI 2017 - Washington, United States
Duration: Aug 7 2017Aug 11 2017

Publication series

NameIEEE International Symposium on Electromagnetic Compatibility
ISSN (Print)1077-4076
ISSN (Electronic)2158-1118

Other

Other2017 IEEE International Symposium on Electromagnetic Compatibility, Signal and Power Integrity, EMCSI 2017
CountryUnited States
CityWashington
Period8/7/178/11/17

ASJC Scopus subject areas

  • Condensed Matter Physics
  • Electrical and Electronic Engineering

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  • Cite this

    Lu, T., Wu, K., Yang, Z., & Jin, J. M. (2017). Modeling capacitor derating in power integrity simulation. In 2017 IEEE International Symposium on Electromagnetic Compatibility, Signal and Power Integrity, EMCSI 2017 - Proceedings (pp. 567-572). [8077933] (IEEE International Symposium on Electromagnetic Compatibility). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/ISEMC.2017.8077933