Mixed quadratic model for peak spatial-average SAR of coherent multiple antenna devices

Arash Ebadi-Shahrivar, Jun Ren, Bertrand M. Hochwald, Patrick Fay, Jian Ming Jin, David J. Love

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Specific Absorption Rate (SAR) is a measure of the electromagnetic exposure of portable devices imposed by regulatory agencies. In this paper, we model peak spatial-average SAR of multiple-antenna portable devices using a simple mixed quadratic function of the transmitted vector signal. The model takes into account the movement of location on peak SAR as the transmitted signal varies in amplitude and relative phase between antennas, and can be applied to any number of antennas. Examples with two and four antennas are presented.

Original languageEnglish (US)
Title of host publication2017 IEEE Antennas and Propagation Society International Symposium, Proceedings
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages1419-1420
Number of pages2
ISBN (Electronic)9781538632840
DOIs
StatePublished - Oct 18 2017
Event2017 IEEE International Symposium on Antennas and Propagation and USNC-URSI Radio Science Meeting, APSURSI 2017 - San Diego, United States
Duration: Jul 9 2017Jul 14 2017

Publication series

Name2017 IEEE Antennas and Propagation Society International Symposium, Proceedings
Volume2017-January

Other

Other2017 IEEE International Symposium on Antennas and Propagation and USNC-URSI Radio Science Meeting, APSURSI 2017
CountryUnited States
CitySan Diego
Period7/9/177/14/17

ASJC Scopus subject areas

  • Radiation
  • Computer Networks and Communications
  • Instrumentation

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    Ebadi-Shahrivar, A., Ren, J., Hochwald, B. M., Fay, P., Jin, J. M., & Love, D. J. (2017). Mixed quadratic model for peak spatial-average SAR of coherent multiple antenna devices. In 2017 IEEE Antennas and Propagation Society International Symposium, Proceedings (pp. 1419-1420). (2017 IEEE Antennas and Propagation Society International Symposium, Proceedings; Vol. 2017-January). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/APUSNCURSINRSM.2017.8072752