TY - GEN
T1 - Mixed device-circuit solution for ESD protection of high-voltage fast pins
AU - Vashchenko, V. A.
AU - Olson, N.
AU - Farrenkopf, D.
AU - Kuznetsov, V.
AU - Hopper, P.
AU - Rosenbaum, E.
PY - 2007
Y1 - 2007
N2 - This paper presents a new solution for ESD protection of high-voltage, high-speed pins in power analog circuits, such as switching voltage regulators. The particular implementation consists of a LDMOS-SCR ESD device with the triggering characteristics controlled by an active circuit. Experimental validation of this new approach is provided.
AB - This paper presents a new solution for ESD protection of high-voltage, high-speed pins in power analog circuits, such as switching voltage regulators. The particular implementation consists of a LDMOS-SCR ESD device with the triggering characteristics controlled by an active circuit. Experimental validation of this new approach is provided.
UR - http://www.scopus.com/inward/record.url?scp=34548742901&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=34548742901&partnerID=8YFLogxK
U2 - 10.1109/RELPHY.2007.369971
DO - 10.1109/RELPHY.2007.369971
M3 - Conference contribution
AN - SCOPUS:34548742901
SN - 1424409195
SN - 9781424409198
T3 - Annual Proceedings - Reliability Physics (Symposium)
SP - 602
EP - 603
BT - 2007 IEEE International Reliability Physics Symposium Proceedings, 45th Annual
T2 - 45th Annual IEEE International Reliability Physics Symposium 2007, IRPS
Y2 - 15 April 2007 through 19 April 2007
ER -