Abstract
We report on the CW power performance at 20 and 30 GHz of 0.25 μm × 100 μm AlGaN/GaN high electron mobility transistors (HEMTs) grown by MOCVD on semi-insulating SiC substrates. The devices exhibited current density of 1300 mA/mm, peak dc extrinsic transconductance of 275 mS/mm, unity current gain cutoff (fT) of 65 GHz, and maximum frequency of oscillation (fmax) of 110 GHz. Saturated output power at 20 GHz was 6.4 W/mm with 16% power added efficiency (PAE), and output power at 1-dB compression at 30 GHz was 4.0 W/mm with 20% PAE. This is the highest power reported for 0.25-μm gate-length devices at 20 GHz, and the 30 GHz results represent the highest frequency power data published to date on GaN-based devices.
Original language | English (US) |
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Pages (from-to) | 93-95 |
Number of pages | 3 |
Journal | IEEE Microwave and Wireless Components Letters |
Volume | 13 |
Issue number | 3 |
DOIs | |
State | Published - Mar 2003 |
Externally published | Yes |
Keywords
- GaN
- High electron mobility transistors (HEMTs)
- Microwave power
- SiC
ASJC Scopus subject areas
- Condensed Matter Physics
- Electrical and Electronic Engineering