Mid-infrared thermomechanical sensitivity of microcantilevers for application to infrared spectroscopy

Beomjin Kwon, William P. King, Matthew Schulmerich, Rohit Bhargava

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

We report the use of bimaterial microcantilever sensors for sensing narrow-band infrared (IR) radiation generated by a monochromator and its application to IR spectroscopy of polymer films. We selected microcantilever sensors of either silicon or silicon nitride and having a thin metal film coating. To assess the IR measurement capability of these cantilevers, the IR sensitivity to noise ratio (SNR), was measured in the mid-IR fingerprint spectral region (5 - 10 μ m or 1000 - 2000 cm-1). The measured SNR was in the range of 8 - 90. We further demonstrated the utility of these sensors by using them to collect an IR absorbance spectrum of 1 μm thick polycarbonate film. The characteristic IR peaks for this film could be seen, and compare well with conventional Fourier Transform IR (FT-IR) data. The spectral resolution of the cantilever sensors determined to be in the range 32 - 64 cm-1.

Original languageEnglish (US)
Title of host publicationIEEE Sensors 2010 Conference, SENSORS 2010
Pages2405-2408
Number of pages4
DOIs
StatePublished - Dec 1 2010
Event9th IEEE Sensors Conference 2010, SENSORS 2010 - Waikoloa, HI, United States
Duration: Nov 1 2010Nov 4 2010

Publication series

NameProceedings of IEEE Sensors

Other

Other9th IEEE Sensors Conference 2010, SENSORS 2010
CountryUnited States
CityWaikoloa, HI
Period11/1/1011/4/10

Fingerprint

Infrared spectroscopy
Infrared radiation
Sensors
Monochromators
Spectral resolution
Polycarbonates
Silicon nitride
Polymer films
Fourier transforms
Silicon
Coatings
Metals

ASJC Scopus subject areas

  • Electrical and Electronic Engineering

Cite this

Kwon, B., King, W. P., Schulmerich, M., & Bhargava, R. (2010). Mid-infrared thermomechanical sensitivity of microcantilevers for application to infrared spectroscopy. In IEEE Sensors 2010 Conference, SENSORS 2010 (pp. 2405-2408). [5691004] (Proceedings of IEEE Sensors). https://doi.org/10.1109/ICSENS.2010.5691004

Mid-infrared thermomechanical sensitivity of microcantilevers for application to infrared spectroscopy. / Kwon, Beomjin; King, William P.; Schulmerich, Matthew; Bhargava, Rohit.

IEEE Sensors 2010 Conference, SENSORS 2010. 2010. p. 2405-2408 5691004 (Proceedings of IEEE Sensors).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Kwon, B, King, WP, Schulmerich, M & Bhargava, R 2010, Mid-infrared thermomechanical sensitivity of microcantilevers for application to infrared spectroscopy. in IEEE Sensors 2010 Conference, SENSORS 2010., 5691004, Proceedings of IEEE Sensors, pp. 2405-2408, 9th IEEE Sensors Conference 2010, SENSORS 2010, Waikoloa, HI, United States, 11/1/10. https://doi.org/10.1109/ICSENS.2010.5691004
Kwon B, King WP, Schulmerich M, Bhargava R. Mid-infrared thermomechanical sensitivity of microcantilevers for application to infrared spectroscopy. In IEEE Sensors 2010 Conference, SENSORS 2010. 2010. p. 2405-2408. 5691004. (Proceedings of IEEE Sensors). https://doi.org/10.1109/ICSENS.2010.5691004
Kwon, Beomjin ; King, William P. ; Schulmerich, Matthew ; Bhargava, Rohit. / Mid-infrared thermomechanical sensitivity of microcantilevers for application to infrared spectroscopy. IEEE Sensors 2010 Conference, SENSORS 2010. 2010. pp. 2405-2408 (Proceedings of IEEE Sensors).
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