Microwave characterization of Purcell enhancement in a microcavity laser

H. W. Then; C. H. Wu; M. Feng; N. Holonyak

doi:10.1063/1.3377913

Microwave characterization of Purcell enhancement in a microcavity laser

H. W. Then, C. H. Wu, M. Feng, N. Holonyak

Electrical and Computer Engineering

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Abstract

A sensitive microwave method is described to study the optical frequency response of a microcavity laser, demonstrating that a quantum-well vertical cavity surface-emitting laser (∼3 μm aperture, ITH =180 μA) can exhibit almost single mode operation (nearly threshold free), and an electron-hole spontaneous lifetime Purcell enhancement of 2.08 times. The microwavemeasurement method employing electrical-to-optical conversion, and distinct separation of electrical input and optical output, is more revealing than photoluminescence decay experiments (and the inconvenient overlap of optical input and output).

Original language	English (US)
Article number	131107
Journal	Applied Physics Letters
Volume	96
Issue number	13
DOIs	https://doi.org/10.1063/1.3377913
State	Published - 2010

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Physics and Astronomy (miscellaneous)

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10.1063/1.3377913

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title = "Microwave characterization of Purcell enhancement in a microcavity laser",

abstract = "A sensitive microwave method is described to study the optical frequency response of a microcavity laser, demonstrating that a quantum-well vertical cavity surface-emitting laser (∼3 μm aperture, ITH =180 μA) can exhibit almost single mode operation (nearly threshold free), and an electron-hole spontaneous lifetime Purcell enhancement of 2.08 times. The microwavemeasurement method employing electrical-to-optical conversion, and distinct separation of electrical input and optical output, is more revealing than photoluminescence decay experiments (and the inconvenient overlap of optical input and output).",

author = "Then, {H. W.} and Wu, {C. H.} and M. Feng and N. Holonyak",

note = "Funding Information: N. Holonyak, Jr., is grateful for the support of the John Bardeen Chair (Sony) of Electrical and Computer Engineering and Physics, and M. Feng for the support of the Nick Holonyak, Jr., Chair of Electrical and Computer Engineering. The authors would like to thank Dr. Michael Gerhold (Army Research Office) and acknowledge the support by Army Research Office, Grant No. W911NF-08-1-0469.",

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journal = "Applied Physics Letters",

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AU - Then, H. W.

AU - Wu, C. H.

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AU - Holonyak, N.

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PY - 2010

Y1 - 2010

N2 - A sensitive microwave method is described to study the optical frequency response of a microcavity laser, demonstrating that a quantum-well vertical cavity surface-emitting laser (∼3 μm aperture, ITH =180 μA) can exhibit almost single mode operation (nearly threshold free), and an electron-hole spontaneous lifetime Purcell enhancement of 2.08 times. The microwavemeasurement method employing electrical-to-optical conversion, and distinct separation of electrical input and optical output, is more revealing than photoluminescence decay experiments (and the inconvenient overlap of optical input and output).

AB - A sensitive microwave method is described to study the optical frequency response of a microcavity laser, demonstrating that a quantum-well vertical cavity surface-emitting laser (∼3 μm aperture, ITH =180 μA) can exhibit almost single mode operation (nearly threshold free), and an electron-hole spontaneous lifetime Purcell enhancement of 2.08 times. The microwavemeasurement method employing electrical-to-optical conversion, and distinct separation of electrical input and optical output, is more revealing than photoluminescence decay experiments (and the inconvenient overlap of optical input and output).

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Microwave characterization of Purcell enhancement in a microcavity laser

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