Microstructural and Microchemical Analysis of Chalcopyrite Cu(In,Ga)Se 2 Films

Chun Ming Li, Chang Hui Lei, Ian M. Robertson, Angus Rockett

Research output: Contribution to journalConference articlepeer-review


The microstructure and micro-chemistry of Cu(In,Ga)Se2 (CIGS) films have been analyzed by means of transmission electron microscopy (TEM). Specimens were obtained from a number of groups producing high-performance solar cells from these materials. Both plan-view and cross-sectional TEM samples were prepared by mechanical grinding and ion milling. Twins can be found easily within the films while dislocations are present only in a few grains and with low density. No extended structural defects such as stacking faults were discovered. X-ray energy dispersive spectroscopy was used to study the chemical composition of grains and grain boundaries. Experimental results showed no difference between the composition in the grain interiors and the grain boundary. In addition, there is no obvious enhancement of oxygen and sodium at grain boundaries. Structural depth dependences were also not found.

Original languageEnglish (US)
Pages (from-to)169-174
Number of pages6
JournalMaterials Research Society Symposium - Proceedings
StatePublished - 2003
EventMATERIALS RESEARCH SOCIETY SYMPOSIUM - PROCEEDINGS: Compound Semiconductor Photovoltaics - San Francisco, CA, United States
Duration: Apr 22 2003Apr 25 2003

ASJC Scopus subject areas

  • General Materials Science
  • Condensed Matter Physics
  • Mechanics of Materials
  • Mechanical Engineering


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