Microstructural and Microchemical Analysis of Chalcopyrite Cu(In,Ga)Se 2 Films

Chun Ming Li; Chang Hui Lei; Ian M. Robertson; Angus Rockett

doi:10.1557/proc-763-b4.2

Microstructural and Microchemical Analysis of Chalcopyrite Cu(In,Ga)Se ₂ Films

Chun Ming Li, Chang Hui Lei, Ian M. Robertson, Angus Rockett

Materials Science and Engineering

Research output: Contribution to journal › Conference article › peer-review

Abstract

The microstructure and micro-chemistry of Cu(In,Ga)Se₂ (CIGS) films have been analyzed by means of transmission electron microscopy (TEM). Specimens were obtained from a number of groups producing high-performance solar cells from these materials. Both plan-view and cross-sectional TEM samples were prepared by mechanical grinding and ion milling. Twins can be found easily within the films while dislocations are present only in a few grains and with low density. No extended structural defects such as stacking faults were discovered. X-ray energy dispersive spectroscopy was used to study the chemical composition of grains and grain boundaries. Experimental results showed no difference between the composition in the grain interiors and the grain boundary. In addition, there is no obvious enhancement of oxygen and sodium at grain boundaries. Structural depth dependences were also not found.

Original language	English (US)
Pages (from-to)	169-174
Number of pages	6
Journal	Materials Research Society Symposium - Proceedings
Volume	763
DOIs	https://doi.org/10.1557/proc-763-b4.2
State	Published - 2003
Event	MATERIALS RESEARCH SOCIETY SYMPOSIUM - PROCEEDINGS: Compound Semiconductor Photovoltaics - San Francisco, CA, United States Duration: Apr 22 2003 → Apr 25 2003

ASJC Scopus subject areas

General Materials Science
Condensed Matter Physics
Mechanics of Materials
Mechanical Engineering

Online availability

10.1557/proc-763-b4.2

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Cite this

@article{bdecddeba97a40e0a89f45de92a1c366,

title = "Microstructural and Microchemical Analysis of Chalcopyrite Cu(In,Ga)Se 2 Films",

abstract = "The microstructure and micro-chemistry of Cu(In,Ga)Se2 (CIGS) films have been analyzed by means of transmission electron microscopy (TEM). Specimens were obtained from a number of groups producing high-performance solar cells from these materials. Both plan-view and cross-sectional TEM samples were prepared by mechanical grinding and ion milling. Twins can be found easily within the films while dislocations are present only in a few grains and with low density. No extended structural defects such as stacking faults were discovered. X-ray energy dispersive spectroscopy was used to study the chemical composition of grains and grain boundaries. Experimental results showed no difference between the composition in the grain interiors and the grain boundary. In addition, there is no obvious enhancement of oxygen and sodium at grain boundaries. Structural depth dependences were also not found.",

author = "Li, {Chun Ming} and Lei, {Chang Hui} and Robertson, {Ian M.} and Angus Rockett",

year = "2003",

doi = "10.1557/proc-763-b4.2",

language = "English (US)",

volume = "763",

pages = "169--174",

journal = "Materials Research Society Symposium - Proceedings",

issn = "0272-9172",

publisher = "Materials Research Society",

note = "MATERIALS RESEARCH SOCIETY SYMPOSIUM - PROCEEDINGS: Compound Semiconductor Photovoltaics ; Conference date: 22-04-2003 Through 25-04-2003",

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TY - JOUR

T1 - Microstructural and Microchemical Analysis of Chalcopyrite Cu(In,Ga)Se 2 Films

AU - Li, Chun Ming

AU - Lei, Chang Hui

AU - Robertson, Ian M.

AU - Rockett, Angus

PY - 2003

Y1 - 2003

N2 - The microstructure and micro-chemistry of Cu(In,Ga)Se2 (CIGS) films have been analyzed by means of transmission electron microscopy (TEM). Specimens were obtained from a number of groups producing high-performance solar cells from these materials. Both plan-view and cross-sectional TEM samples were prepared by mechanical grinding and ion milling. Twins can be found easily within the films while dislocations are present only in a few grains and with low density. No extended structural defects such as stacking faults were discovered. X-ray energy dispersive spectroscopy was used to study the chemical composition of grains and grain boundaries. Experimental results showed no difference between the composition in the grain interiors and the grain boundary. In addition, there is no obvious enhancement of oxygen and sodium at grain boundaries. Structural depth dependences were also not found.

AB - The microstructure and micro-chemistry of Cu(In,Ga)Se2 (CIGS) films have been analyzed by means of transmission electron microscopy (TEM). Specimens were obtained from a number of groups producing high-performance solar cells from these materials. Both plan-view and cross-sectional TEM samples were prepared by mechanical grinding and ion milling. Twins can be found easily within the films while dislocations are present only in a few grains and with low density. No extended structural defects such as stacking faults were discovered. X-ray energy dispersive spectroscopy was used to study the chemical composition of grains and grain boundaries. Experimental results showed no difference between the composition in the grain interiors and the grain boundary. In addition, there is no obvious enhancement of oxygen and sodium at grain boundaries. Structural depth dependences were also not found.

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