Abstract
A form of optical second-harmonic microscopy has been developed that spatially resolves concentration gradients of surface adsorbates. Surface concentration profiles at submonolayer levels are illuminated with a pulsed laser, and the reflected second-harmonic light is imaged into a photodiode array. Micrometer-scale resolution is obtainable while the surface damage and the spurious chemistry induced by more conventional electron- or ion-based techniques are avoided. We have used this microscopy to monitor the surface diffusion of Sb on Ge(111).
| Original language | English (US) |
|---|---|
| Pages (from-to) | 546-550 |
| Number of pages | 5 |
| Journal | Journal of the Optical Society of America B: Optical Physics |
| Volume | 10 |
| Issue number | 3 |
| DOIs | |
| State | Published - Mar 1993 |
ASJC Scopus subject areas
- Statistical and Nonlinear Physics
- Atomic and Molecular Physics, and Optics