Abstract

This paper reports improvements of atomic force microscopy (AFM) mass spectrometry (MS), in which ∼1 attoliter of analyte is desorbed by a heated AFM cantilever tip and analyzed with a mass spectrometer. Decoupling the AFM sampling apparatus from the MS system enabled analysis of the microscale transport physics independent of analyte ionization efficiency. Using this approach, we find that the transport efficiency is governed by the air velocity during sampling, and not mass flow rate as reported in the literature. We also find that an unheated sampling tube results in higher efficiency compared to a heated tube. Optimization of the transport parameters improved the system efficiency by 2.5-fold over the state of the art.

Original languageEnglish (US)
Title of host publicationTRANSDUCERS 2017 - 19th International Conference on Solid-State Sensors, Actuators and Microsystems
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages24-27
Number of pages4
ISBN (Electronic)9781538627310
DOIs
StatePublished - Jul 26 2017
Event19th International Conference on Solid-State Sensors, Actuators and Microsystems, TRANSDUCERS 2017 - Kaohsiung, Taiwan, Province of China
Duration: Jun 18 2017Jun 22 2017

Publication series

NameTRANSDUCERS 2017 - 19th International Conference on Solid-State Sensors, Actuators and Microsystems

Other

Other19th International Conference on Solid-State Sensors, Actuators and Microsystems, TRANSDUCERS 2017
CountryTaiwan, Province of China
CityKaohsiung
Period6/18/176/22/17

Fingerprint

microbalances
Mass spectrometry
Atomic force microscopy
mass spectroscopy
Physics
sampling
atomic force microscopy
Sampling
physics
tubes
mass flow rate
systems analysis
Mass spectrometers
decoupling
mass spectrometers
Ionization
Flow rate
ionization
optimization
air

Keywords

  • Atomic force microscopy
  • heated cantilever
  • mass spectrometry
  • thermal desorption
  • transport physics

ASJC Scopus subject areas

  • Chemical Health and Safety
  • Instrumentation
  • Electrical and Electronic Engineering

Cite this

Moon, H., Comi, T. J., Dunham, S. J. B., Kwon, B., Sweedler, J. V., & King, W. P. (2017). Microscale transport physics during atomic force microscopy mass spectrometry and improved sampling efficiency. In TRANSDUCERS 2017 - 19th International Conference on Solid-State Sensors, Actuators and Microsystems (pp. 24-27). [7993978] (TRANSDUCERS 2017 - 19th International Conference on Solid-State Sensors, Actuators and Microsystems). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/TRANSDUCERS.2017.7993978

Microscale transport physics during atomic force microscopy mass spectrometry and improved sampling efficiency. / Moon, Hyunkyu; Comi, Troy J.; Dunham, Sage J.B.; Kwon, Beomjin; Sweedler, Jonathan V; King, William Paul.

TRANSDUCERS 2017 - 19th International Conference on Solid-State Sensors, Actuators and Microsystems. Institute of Electrical and Electronics Engineers Inc., 2017. p. 24-27 7993978 (TRANSDUCERS 2017 - 19th International Conference on Solid-State Sensors, Actuators and Microsystems).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Moon, H, Comi, TJ, Dunham, SJB, Kwon, B, Sweedler, JV & King, WP 2017, Microscale transport physics during atomic force microscopy mass spectrometry and improved sampling efficiency. in TRANSDUCERS 2017 - 19th International Conference on Solid-State Sensors, Actuators and Microsystems., 7993978, TRANSDUCERS 2017 - 19th International Conference on Solid-State Sensors, Actuators and Microsystems, Institute of Electrical and Electronics Engineers Inc., pp. 24-27, 19th International Conference on Solid-State Sensors, Actuators and Microsystems, TRANSDUCERS 2017, Kaohsiung, Taiwan, Province of China, 6/18/17. https://doi.org/10.1109/TRANSDUCERS.2017.7993978
Moon H, Comi TJ, Dunham SJB, Kwon B, Sweedler JV, King WP. Microscale transport physics during atomic force microscopy mass spectrometry and improved sampling efficiency. In TRANSDUCERS 2017 - 19th International Conference on Solid-State Sensors, Actuators and Microsystems. Institute of Electrical and Electronics Engineers Inc. 2017. p. 24-27. 7993978. (TRANSDUCERS 2017 - 19th International Conference on Solid-State Sensors, Actuators and Microsystems). https://doi.org/10.1109/TRANSDUCERS.2017.7993978
Moon, Hyunkyu ; Comi, Troy J. ; Dunham, Sage J.B. ; Kwon, Beomjin ; Sweedler, Jonathan V ; King, William Paul. / Microscale transport physics during atomic force microscopy mass spectrometry and improved sampling efficiency. TRANSDUCERS 2017 - 19th International Conference on Solid-State Sensors, Actuators and Microsystems. Institute of Electrical and Electronics Engineers Inc., 2017. pp. 24-27 (TRANSDUCERS 2017 - 19th International Conference on Solid-State Sensors, Actuators and Microsystems).
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