TY - GEN
T1 - Microporous silicon for CMOS compatible MST
AU - Valera, E.
AU - Duch, M.
AU - Rodríguez, A.
AU - Esteve, J.
PY - 2005
Y1 - 2005
N2 - The use of selectively formed microporous silicon as a sacrificial layer in silicon micromachining has been studied. Porous silicon formation, by isotropic etching in hydrofluoric acid (HP) can be selective, by creating n-type areas on a p-type substrate, or also, using polycrystalline silicon under adequate conditions. Porous silicon can be removed easily by CMOS compatible chemicals. Using this technology, free standing membranes, cantilevers, bridges and microchannels, can be fabricated. Porous silicon etching is much easier and faster than crystalline silicon isotropic etching, and both fabrication and etching of the porous film can be performed at, or nearly at room temperature. Thick layers of porous silicon can be easily produced. The formation conditions of the microporous silicon layer and the etch conditions for microstructures fabrication are described.
AB - The use of selectively formed microporous silicon as a sacrificial layer in silicon micromachining has been studied. Porous silicon formation, by isotropic etching in hydrofluoric acid (HP) can be selective, by creating n-type areas on a p-type substrate, or also, using polycrystalline silicon under adequate conditions. Porous silicon can be removed easily by CMOS compatible chemicals. Using this technology, free standing membranes, cantilevers, bridges and microchannels, can be fabricated. Porous silicon etching is much easier and faster than crystalline silicon isotropic etching, and both fabrication and etching of the porous film can be performed at, or nearly at room temperature. Thick layers of porous silicon can be easily produced. The formation conditions of the microporous silicon layer and the etch conditions for microstructures fabrication are described.
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U2 - 10.1109/SCED.2005.1504489
DO - 10.1109/SCED.2005.1504489
M3 - Conference contribution
AN - SCOPUS:33745711871
SN - 0780388100
SN - 9780780388109
T3 - 2005 Spanish Conference on Electron Devices, Proceedings
SP - 481
EP - 483
BT - 2005 Spanish Conference on Electron Devices, Proceedings
T2 - 2005 Spanish Conference on Electron Devices
Y2 - 2 February 2005 through 4 February 2005
ER -