Microelectronic Engineering Special Issue: Characterization and mechanical reliability of advanced electronic materials at nanoscale

Alex A. Volinsky, Harley Johnson, Surya Ganti, Pradeep Sharma

Research output: Contribution to journalConference articlepeer-review

Original languageEnglish (US)
Pages (from-to)1-2
Number of pages2
JournalMicroelectronic Engineering
Volume75
Issue number1
DOIs
StatePublished - Jul 2004
EventProceedings of the Symposium on Characterization - Phoenix, AZ, United States
Duration: Jun 17 2003Jun 20 2003

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Atomic and Molecular Physics, and Optics
  • Condensed Matter Physics
  • Surfaces, Coatings and Films
  • Electrical and Electronic Engineering

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