Microanalytical Study of Defect Formation in Thin Bismuth Strontium Calcium Copper Oxide Films

R. H. Howell, A. Chaiken, R. G. Musket, M. A. Wall, M. Balooch, D. Phinney, M. J. Russ, J. N. Eckstein, I. Bozovic, G. F. Virshup

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Material Science

Physics