Microanalytical Study of Defect Formation in Thin Bismuth Strontium Calcium Copper Oxide Films

R. H. Howell; A. Chaiken; R. G. Musket; M. A. Wall; M. Balooch; D. Phinney; M. J. Russ; J. N. Eckstein; I. Bozovic; G. F. Virshup

doi:10.1117/12.182681

Microanalytical Study of Defect Formation in Thin Bismuth Strontium Calcium Copper Oxide Films

R. H. Howell, A. Chaiken, R. G. Musket, M. A. Wall, M. Balooch, D. Phinney, M. J. Russ, J. N. Eckstein, I. Bozovic, G. F. Virshup

Research output: Contribution to journal › Conference article › peer-review

Abstract

Thin bismuth strontium calcium copper oxide (BSCCO) films and BSCCO/insulatorfBSCCO trilayers have been prepared on SrTiO3 and MgO substrates by evaporation from elemental sources in an ozone atmosphere. Accurate control of the stoichiometry is achieved through monitoring of the atomic fluxes by use of in situ atomic absorption spectroscopy, as well as by reflection high-energy electron diffraction (RI-WED). Nevertheless, nanometer-scale second-phase precipitates are sometimes observed. These defects and the flat regions around them have been probed by a variety of microanalytical techniques, including Rutherford backscattering spectroscopy (RBS), particle-induced x-ray emission (PIXE), atomic force microscopy (AFM), microscopic secondary ion mass spectroscopy and transmission electron microscopy (TEM).

Original language	English (US)
Pages (from-to)	182-190
Number of pages	9
Journal	Proceedings of SPIE - The International Society for Optical Engineering
Volume	2158
DOIs	https://doi.org/10.1117/12.182681
State	Published - Aug 10 1994
Externally published	Yes
Event	Oxide Superconductor Physics and Nano-Engineering 1994 - Los Angeles, United States Duration: Jan 23 1994 → Jan 29 1994

ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials
Condensed Matter Physics
Computer Science Applications
Applied Mathematics
Electrical and Electronic Engineering

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10.1117/12.182681

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title = "Microanalytical Study of Defect Formation in Thin Bismuth Strontium Calcium Copper Oxide Films",

abstract = "Thin bismuth strontium calcium copper oxide (BSCCO) films and BSCCO/insulatorfBSCCO trilayers have been prepared on SrTiO3 and MgO substrates by evaporation from elemental sources in an ozone atmosphere. Accurate control of the stoichiometry is achieved through monitoring of the atomic fluxes by use of in situ atomic absorption spectroscopy, as well as by reflection high-energy electron diffraction (RI-WED). Nevertheless, nanometer-scale second-phase precipitates are sometimes observed. These defects and the flat regions around them have been probed by a variety of microanalytical techniques, including Rutherford backscattering spectroscopy (RBS), particle-induced x-ray emission (PIXE), atomic force microscopy (AFM), microscopic secondary ion mass spectroscopy and transmission electron microscopy (TEM).",

author = "Howell, {R. H.} and A. Chaiken and Musket, {R. G.} and Wall, {M. A.} and M. Balooch and D. Phinney and Russ, {M. J.} and Eckstein, {J. N.} and I. Bozovic and Virshup, {G. F.}",

note = "Publisher Copyright: {\textcopyright} 1994 Proceedings of SPIE - The International Society for Optical Engineering. All rights reserved.; Oxide Superconductor Physics and Nano-Engineering 1994 ; Conference date: 23-01-1994 Through 29-01-1994",

year = "1994",

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doi = "10.1117/12.182681",

language = "English (US)",

volume = "2158",

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TY - JOUR

T1 - Microanalytical Study of Defect Formation in Thin Bismuth Strontium Calcium Copper Oxide Films

AU - Howell, R. H.

AU - Chaiken, A.

AU - Musket, R. G.

AU - Wall, M. A.

AU - Balooch, M.

AU - Phinney, D.

AU - Russ, M. J.

AU - Eckstein, J. N.

AU - Bozovic, I.

AU - Virshup, G. F.

PY - 1994/8/10

Y1 - 1994/8/10

N2 - Thin bismuth strontium calcium copper oxide (BSCCO) films and BSCCO/insulatorfBSCCO trilayers have been prepared on SrTiO3 and MgO substrates by evaporation from elemental sources in an ozone atmosphere. Accurate control of the stoichiometry is achieved through monitoring of the atomic fluxes by use of in situ atomic absorption spectroscopy, as well as by reflection high-energy electron diffraction (RI-WED). Nevertheless, nanometer-scale second-phase precipitates are sometimes observed. These defects and the flat regions around them have been probed by a variety of microanalytical techniques, including Rutherford backscattering spectroscopy (RBS), particle-induced x-ray emission (PIXE), atomic force microscopy (AFM), microscopic secondary ion mass spectroscopy and transmission electron microscopy (TEM).

AB - Thin bismuth strontium calcium copper oxide (BSCCO) films and BSCCO/insulatorfBSCCO trilayers have been prepared on SrTiO3 and MgO substrates by evaporation from elemental sources in an ozone atmosphere. Accurate control of the stoichiometry is achieved through monitoring of the atomic fluxes by use of in situ atomic absorption spectroscopy, as well as by reflection high-energy electron diffraction (RI-WED). Nevertheless, nanometer-scale second-phase precipitates are sometimes observed. These defects and the flat regions around them have been probed by a variety of microanalytical techniques, including Rutherford backscattering spectroscopy (RBS), particle-induced x-ray emission (PIXE), atomic force microscopy (AFM), microscopic secondary ion mass spectroscopy and transmission electron microscopy (TEM).

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EP - 190

JO - Proceedings of SPIE - The International Society for Optical Engineering

JF - Proceedings of SPIE - The International Society for Optical Engineering

T2 - Oxide Superconductor Physics and Nano-Engineering 1994

Y2 - 23 January 1994 through 29 January 1994

ER -

Microanalytical Study of Defect Formation in Thin Bismuth Strontium Calcium Copper Oxide Films

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