Microanalytical Study of Defect Formation in Thin Bismuth Strontium Calcium Copper Oxide Films

R. H. Howell, A. Chaiken, R. G. Musket, M. A. Wall, M. Balooch, D. Phinney, M. J. Russ, J. N. Eckstein, I. Bozovic, G. F. Virshup

Research output: Contribution to journalConference articlepeer-review


Thin bismuth strontium calcium copper oxide (BSCCO) films and BSCCO/insulatorfBSCCO trilayers have been prepared on SrTiO3 and MgO substrates by evaporation from elemental sources in an ozone atmosphere. Accurate control of the stoichiometry is achieved through monitoring of the atomic fluxes by use of in situ atomic absorption spectroscopy, as well as by reflection high-energy electron diffraction (RI-WED). Nevertheless, nanometer-scale second-phase precipitates are sometimes observed. These defects and the flat regions around them have been probed by a variety of microanalytical techniques, including Rutherford backscattering spectroscopy (RBS), particle-induced x-ray emission (PIXE), atomic force microscopy (AFM), microscopic secondary ion mass spectroscopy and transmission electron microscopy (TEM).

Original languageEnglish (US)
Pages (from-to)182-190
Number of pages9
JournalProceedings of SPIE - The International Society for Optical Engineering
StatePublished - Aug 10 1994
Externally publishedYes
EventOxide Superconductor Physics and Nano-Engineering 1994 - Los Angeles, United States
Duration: Jan 23 1994Jan 29 1994

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering


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