Method for measuring the refractive index of transparent solids

Jay D. Bass, Donald J. Weidner

Research output: Contribution to journalArticle

Abstract

A method for determining the refractive indices of transparent isotropic or anisotropic solids is presented. The method utilizes null position measurements of light deflected by a sample immersed in a liquid of known index. Measurements of absolute deflection angles are not involved. Natural crystal growth faces, even at right angles, can serve as prism faces, thus eliminating the need for extensive surface preparation. Consequently, this method is particularly well suited for measuring the refractive index of small samples with high indices. Using a simple refractometer, results were obtained for two biaxial and one isotropic material with high refractive indices: Ni 2SiO4 with the spinel structure (maximum dimension of 0.12 mm), Ni2SiO4 (olivine structure), and GdAlO3 (perovskite structure). Uncertainties of less than 0.1% are obtained from visual observations of the refracted light. Increased accuracy is possible by improving the calibration of the immersion liquid refractive index and the detection system.

Original languageEnglish (US)
Pages (from-to)1569-1573
Number of pages5
JournalReview of Scientific Instruments
Volume55
Issue number10
DOIs
StatePublished - Dec 1 1984
Externally publishedYes

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Refractive index
refractivity
Refractometers
refractometers
Olivine
Position measurement
visual observation
Liquids
liquids
Prisms
Crystal growth
olivine
Perovskite
submerging
prisms
spinel
crystal growth
deflection
Calibration
preparation

ASJC Scopus subject areas

  • Instrumentation

Cite this

Method for measuring the refractive index of transparent solids. / Bass, Jay D.; Weidner, Donald J.

In: Review of Scientific Instruments, Vol. 55, No. 10, 01.12.1984, p. 1569-1573.

Research output: Contribution to journalArticle

@article{afc654cee1bd457690a0bca39a12c568,
title = "Method for measuring the refractive index of transparent solids",
abstract = "A method for determining the refractive indices of transparent isotropic or anisotropic solids is presented. The method utilizes null position measurements of light deflected by a sample immersed in a liquid of known index. Measurements of absolute deflection angles are not involved. Natural crystal growth faces, even at right angles, can serve as prism faces, thus eliminating the need for extensive surface preparation. Consequently, this method is particularly well suited for measuring the refractive index of small samples with high indices. Using a simple refractometer, results were obtained for two biaxial and one isotropic material with high refractive indices: Ni 2SiO4 with the spinel structure (maximum dimension of 0.12 mm), Ni2SiO4 (olivine structure), and GdAlO3 (perovskite structure). Uncertainties of less than 0.1{\%} are obtained from visual observations of the refracted light. Increased accuracy is possible by improving the calibration of the immersion liquid refractive index and the detection system.",
author = "Bass, {Jay D.} and Weidner, {Donald J.}",
year = "1984",
month = "12",
day = "1",
doi = "10.1063/1.1137611",
language = "English (US)",
volume = "55",
pages = "1569--1573",
journal = "Review of Scientific Instruments",
issn = "0034-6748",
publisher = "American Institute of Physics Publising LLC",
number = "10",

}

TY - JOUR

T1 - Method for measuring the refractive index of transparent solids

AU - Bass, Jay D.

AU - Weidner, Donald J.

PY - 1984/12/1

Y1 - 1984/12/1

N2 - A method for determining the refractive indices of transparent isotropic or anisotropic solids is presented. The method utilizes null position measurements of light deflected by a sample immersed in a liquid of known index. Measurements of absolute deflection angles are not involved. Natural crystal growth faces, even at right angles, can serve as prism faces, thus eliminating the need for extensive surface preparation. Consequently, this method is particularly well suited for measuring the refractive index of small samples with high indices. Using a simple refractometer, results were obtained for two biaxial and one isotropic material with high refractive indices: Ni 2SiO4 with the spinel structure (maximum dimension of 0.12 mm), Ni2SiO4 (olivine structure), and GdAlO3 (perovskite structure). Uncertainties of less than 0.1% are obtained from visual observations of the refracted light. Increased accuracy is possible by improving the calibration of the immersion liquid refractive index and the detection system.

AB - A method for determining the refractive indices of transparent isotropic or anisotropic solids is presented. The method utilizes null position measurements of light deflected by a sample immersed in a liquid of known index. Measurements of absolute deflection angles are not involved. Natural crystal growth faces, even at right angles, can serve as prism faces, thus eliminating the need for extensive surface preparation. Consequently, this method is particularly well suited for measuring the refractive index of small samples with high indices. Using a simple refractometer, results were obtained for two biaxial and one isotropic material with high refractive indices: Ni 2SiO4 with the spinel structure (maximum dimension of 0.12 mm), Ni2SiO4 (olivine structure), and GdAlO3 (perovskite structure). Uncertainties of less than 0.1% are obtained from visual observations of the refracted light. Increased accuracy is possible by improving the calibration of the immersion liquid refractive index and the detection system.

UR - http://www.scopus.com/inward/record.url?scp=0021510591&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0021510591&partnerID=8YFLogxK

U2 - 10.1063/1.1137611

DO - 10.1063/1.1137611

M3 - Article

AN - SCOPUS:0021510591

VL - 55

SP - 1569

EP - 1573

JO - Review of Scientific Instruments

JF - Review of Scientific Instruments

SN - 0034-6748

IS - 10

ER -